Polymer gate dielectric surface viscoelasticity modulates pentacene transistor performance

Science

Volumn 318, Issue 5847, 2007, Pages 76-80

  Kim, Choongik ^a   Facchetti, Antonio ^a   Marks, Tobin J ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMER;

COMPARATIVE STUDY; DIELECTRIC PROPERTY; OPTIMIZATION; POLYMER; VISCOELASTICITY;

ARTICLE; DIELECTRIC CONSTANT; ELECTRIC ACTIVITY; ELECTRIC CURRENT; GLASS TRANSITION TEMPERATURE; MATERIALS TESTING; PARTICLE SIZE; POLYMER PRODUCTION; PRIORITY JOURNAL; SEMICONDUCTOR; VISCOELASTICITY;

NESOVITREA DALLIANA;

EID: 35148891216     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1146458     Document Type: Article

References (40)

1. J. A. Rogers, Z. Bao, H. E. Katz, A. Dodabalapur, in Thin-Film Transistors, C. R. Kagan, P. Andry, Eds. (Marcel Dekker, New York, 2003), pp. 377-425.
2. R. Brown, A. Pomp, C. M. Hart, D. M. de Leeuw, Science 270, 972 (1995).
3. V. C. Sundar et al., Science 303, 1644 (2004).
4. L.-L. Chua et al., Nature 434, 194 (2005).
5. M. J. Panzer, C. D. Frisbie, J. Am. Chem. Soc. 127, 6960 (2005).
6. A. Facchetti, M.-H. Yoon, T. J. Marks, Adv. Mater. 17, 1705 (2005).
7. A. Salleo, M. L. Chabinyc, M. S. Yang, R. A. Street, Appl. Phys. Lett. 81, 4383 (2002).
8. T. Takahashi, T. Takenobu, J. Takeya, Y. Iwasa, Appl. Phys. Lett. 88, 033505 (2006).
9. N. Stutzmann, R. H. Friend, H. Sirringhaus, Science 299, 1881 (2003).
10. M.-H. Yoon, C. Kim, A. Facchetti, T. J. Marks, J. Am. Chem. Soc. 128, 12851 (2006).
11. L. Berthier et al., Science 310, 1797 (2005).
12. L. A. Deschenes, D. A. Vanden Bout, Science 292, 255 (2001).
13. P. G. Debenedetti, F. H. Stillinger, Nature 410, 259 (2001).
14. J. A. Forrest, K. Dalnoki-Veress, J. R. Dutcher, Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Top. 56, 5705 (1997).
15. C. L. Jackson, G. B. McKenna, J. Non-Cryst. Solids 131-133, 221 (1991).
16. S. Kawana, R. A. L. Jones, Phys. Rev. E Stat. Phys. Nonlin. Soft Matter Phys. 63, 021501 (2001).
17. K. Fukao, Y. Miyamoto, Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Top. 61, 1743 (2000).
18. J. A. Forrest, K. Dalnoki-Veress, J. R. Stevens, J. R. Dutcher, Phys. Rev. Lett. 77, 2002 (1996).
19. C. J. Ellison, M. K. Mundra, J. M. Torkelson, Macromolecules 38, 1767 (2005).
20. J. A. Forrest, K. Dalnoki-Veress, Adv. Coll. Interf. Sci. 94, 167 (2001).
21. O. Prucker et al., Macromol. Chem. Phys. 199, 1435 (1998).
22. These coefficients were estimated from the data provided by (19).
23. H. Klauk, U. Zschieschang, J. Pflaum, M. Halik, Nature 445, 745 (2007).
24. R. Ruiz, A. Papadimitratos, A. C. Mayer, G. G. Malliaras, Adv. Mater. 17, 1795 (2005).
25. C. D. Dimitrakopoulos et al., Science 283, 822 (1999).
26. A. L. Briseno et al., Nature 444, 913 (2006).
27. Materials and methods are available as supporting material on Science Online.
28. K. Puntambekar, J. Dong, G. Haugstad, C. D. Frisbie, Adv. Funct. Mater. 16, 879 (2006).
29. K. N. N. Unni, S. Dabos-Seignon, J.-M. Nunzi, J. Mater. Sci. 41, 317 (2006).
30. C. D. Dimitrakopoulos, A. R. Brown, A. Pomp, J. Appl. Phys. 80, 2501 (1996).
31. H. Yanagisawa, T. Tamaki, M. Nakamura, K. Kudo, Thin Solid Films 464-465, 398 (2004).
32. D. L. Smith, Thin-Film Deposition: Principles and Practice (McGraw Hill, New York, 1995).
33. Z. Zhang, M. G. Lagally, Science 276, 377 (1997).
34. K. Tanaka, A. Takahara, T. Kajiyama, Macromolecules 33, 7588 (2000).
35. S. Ge et al., Phys. Rev. Lett. 85, 2340 (2000).
36. S. Steudel et al., Appl. Phys. Lett. 85, 4400 (2004).
37. D. Knipp, R. A. Street, A. R. Volkel, A. Ho, J. Appl. Phys. 93, 347 (2003).
38. S. Guruvenket, G. M. Rao, M. Komath, A. M. Raichur, Appl. Surf. Sci. 236, 278 (2004).
39. R. W. Paynter, Surf. Interface Anal. 33, 862 (2002).
40. We thank J. M. Torkelson and J. Kim for helpful discussion. This work was supported by the Air Force Office of Scientific Research (grant STTRFA 9550-04-0080), Polyera Corp., and the NSF Materials Research Science and Engineering Centers program through the Northwestern Materials Research Center (grant DMR-0520513). This contribution is dedicated to Prof. G. A. Pagani on the occasion of his 70th birthday.