Bias stress in organic thin-film transistors and logic gates

Applied Physics Letters

Volumn 79, Issue 8, 2001, Pages 1124-1126

  Zilker, S J ^a   Detcheverry, C ^a   Cantatore, E ^a   De Leeuw, D M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035920672     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1394718     Document Type: Article

References (7)

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