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Volumn 101, Issue 18, 2012, Pages

Short channel effects on gallium nitride/gallium oxide nanowire transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONFINEMENTS; DRAIN FIELDS; ELECTRON VELOCITY; GAN/SAPPHIRE; HIGH-K DIELECTRIC; METAL OXIDE SEMICONDUCTOR; NANOWIRE TRANSISTORS; NEGATIVE CHARGE; POSITIVE CHARGES; SATURATION CURRENT; SHORT-CHANNEL EFFECT; TRANSISTOR GATE LENGTH;

EID: 84868663204     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764554     Document Type: Article
Times cited : (20)

References (29)
  • 4
  • 9
    • 66049115381 scopus 로고    scopus 로고
    • 10.1016/j.mee.2009.03.129
    • H. Iwai, Microelectron. Eng. 86, 1520 (2009). 10.1016/j.mee.2009.03.129
    • (2009) Microelectron. Eng. , vol.86 , pp. 1520
    • Iwai, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.