A short working distance multiple crystal x-ray spectrometer

Review of Scientific Instruments

Volumn 79, Issue 12, 2008, Pages

  Dickinson, B ^a   Seidler, G T ^a   Webb, Z W ^a   Bradley, J A ^a   Nagle, K P ^a   Heald, S M ^b   Gordon, R A ^c   Chou, I M ^d  

^a UNIVERSITY OF WASHINGTON   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c SIMON FRASER UNIVERSITY   (Canada)

^d U S GEOLOGICAL SURVEY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; LIGHT SOURCES; MANGANESE OXIDE; SPECTROMETERS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY SCATTERING;

HIGH-ENERGY RESOLUTION; LINAC COHERENT LIGHT SOURCE; PARTIAL FLUORESCENCE YIELDS; PROTOTYPE INSTRUMENT; RESONANT INELASTIC X-RAY SCATTERING; SPHERICALLY BENT CRYSTALS; X RAY ABSORPTION NEAR EDGE STRUCTURE; X-RAY EMISSION SPECTRA;

X RAY SPECTROMETERS;

MANGANESE DERIVATIVE; MANGANESE OXIDE; OXIDE;

ARTICLE; CALIBRATION; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT DESIGN; INSTRUMENTATION; LASER; MATERIALS TESTING; METHODOLOGY; OPTICS; RADIATION SCATTERING; SPECTROMETRY; THEORETICAL MODEL; X RAY;

CALIBRATION; CRYSTALLIZATION; EQUIPMENT DESIGN; LASERS; MANGANESE COMPOUNDS; MATERIALS TESTING; MODELS, THEORETICAL; OPTICS AND PHOTONICS; OXIDES; SCATTERING, RADIATION; SPECTROMETRY, X-RAY EMISSION; X-RAYS;

EID: 58149263863     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3048544     Document Type: Article

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