High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Journal of Electron Spectroscopy and Related Phenomena

Volumn 137-140, Issue SPEC. ISS., 2004, Pages 687-690

  Hoszowska, J ^a   Dousse, J Cl ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

Atomic level widths; Double photoexcitation; High resolution X ray spectrometer; RIXS; XES

Indexed keywords

ARGON; CHARGE COUPLED DEVICES; CRYSTAL ATOMIC STRUCTURE; DETECTORS; MONOCHROMATORS; PHOTOIONIZATION; SYNCHROTRON RADIATION; X RAY SCATTERING; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

ATOMIC-LEVEL WIDTHS; DOUBLE PHOTOEXCITATION; HIGH-RESOLUTION X-RAY SPECTROMETER; RIXS; XES;

ELECTRON SPECTROSCOPY;

EID: 2942531142     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.005     Document Type: Conference Paper

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