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Optics Letters

Volumn 37, Issue 21, 2012, Pages 4464-4466

Grating-based at-wavelength metrology of hard x-ray reflective optics

(2) Berujon, Sebastien a,b Ziegler, Eric a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b DIAMOND LIGHT SOURCE LTD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HARD X RAY; HARD X-RAY MIRRORS; INCOHERENT LIGHT; MECHANICAL WORKING; MIRROR SHAPE; PRIORI INFORMATION; SHAPE RECONSTRUCTION; SPATIAL RESOLUTION; SUBMILLIMETERS; VISIBLE LIGHT; X-RAY REFLECTIVE;

REFLECTION;

MIRRORS;

EID: 84868320012 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.004464 Document Type: Article

Times cited : (25)

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