메뉴 건너뛰기




Volumn 107, Issue , 2012, Pages 272-282

Local rear contacts to silicon solar cells by in-line high-rate evaporation of aluminum

Author keywords

Contact recombination; Contact resistivity; In line evaporation; Loss analysis; Rear contact; Silicon solar cell

Indexed keywords

ALUMINUM OXIDES; CONTACT PROPERTIES; CONTACT RESISTIVITIES; HIGH RATE; IN-LINE; LOSS ANALYSIS; P-TYPE SILICON; P-TYPE WAFER; REAR SIDE; SATURATION CURRENT DENSITIES; SCREEN-PRINTED; SURFACE DOPING;

EID: 84867581113     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2012.06.047     Document Type: Article
Times cited : (21)

References (52)
  • 2
    • 0034268274 scopus 로고    scopus 로고
    • Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide
    • M. Kerr, J. Schmidt, and A. Cuevas Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide Progress in Photovoltaics: Research and Applications 8 2000 529 536
    • (2000) Progress in Photovoltaics: Research and Applications , vol.8 , pp. 529-536
    • Kerr, M.1    Schmidt, J.2    Cuevas, A.3
  • 6
    • 84867578685 scopus 로고    scopus 로고
    • 20% efficient rear side passivated solar cells in pilot series designed for conventional module assembly
    • 5-9 September Hamburg, Germany
    • A. Mohr, P. Engelhart, C. Klenke, S. Wanka, A. Stekolnikov, M.Scherff, R. Seguin, S. Tardon, T. Rudolph, M. Hofmann, F. Stenzel, J. Lee, S. Diez, J. Wendt, W. Brendle, S. Schmidt, J. Müller, P. Wawer, M. Hofmann, P. Saint-Cast, J. Nekarda, D. Erath, J. Rentsch, R. Preu, 20% efficient rear side passivated solar cells in pilot series designed for conventional module assembly, in: Proceedings of the 26st European Photovoltaic Solar Energy Conference, 5-9 September 2011, Hamburg, Germany, pp. 2150-2153.
    • (2011) Proceedings of the 26st European Photovoltaic Solar Energy Conference , pp. 2150-2153
    • A. Mohr1
  • 8
    • 84865190245 scopus 로고    scopus 로고
    • Inline high-rate thermal evaporation of aluminum as a novel industrial solar cell metallization scheme
    • 14-15 April Constance, BW, Germany
    • F.Heinemeyer, C. Mader, D. Münster, T. Dullweber, N.-P. Harder, R. Brendel, Inline high-rate thermal evaporation of aluminum as a novel industrial solar cell metallization scheme, in: Proceedings of the 2nd Workshop on Metallization, 14-15 April 2010, Constance, BW, Germany, pp. 48-51.
    • (2010) Proceedings of the 2nd Workshop on Metallization , pp. 48-51
    • Heinemeyer, F.1
  • 9
    • 78650120911 scopus 로고    scopus 로고
    • Rear side point-contacts by in-line thermal evaporation of aluminum
    • 20-25 June Honolulu, HI, USA
    • C. Mader, J. Müller, S. Gatz, T. Dullweber, R. Brendel, Rear side point-contacts by in-line thermal evaporation of aluminum, in: Proceedings of the 35th IEEE Photovoltaic Specialists Conference, 20-25 June 2010, Honolulu, HI, USA, pp. 1446-1449.
    • (2010) Proceedings of the 35th IEEE Photovoltaic Specialists Conference , pp. 1446-1449
    • C. Mader1
  • 10
    • 0022306789 scopus 로고
    • Measurement of the emitter saturation current by a contactless photoconductivity decay method
    • 21-25 October Las Vegas, NV, USA
    • D. Kane, R. Swanson, Measurement of the emitter saturation current by a contactless photoconductivity decay method, in: Proceedings of the 18th IEEE Photovoltaic Specialists Conference, 21-25 October 1985, Las Vegas, NV, USA, pp. 578-583.
    • (1985) Proceedings of the 18th IEEE Photovoltaic Specialists Conference , pp. 578-583
    • Kane, D.1    Swanson, R.2
  • 11
    • 33845421788 scopus 로고    scopus 로고
    • General parameterization of Auger recombination in crystal Silicon
    • M. Kerr, and A. Cuevas General parameterization of Auger recombination in crystal Silicon Journal of Applied Physics 91 2002 2473 2480
    • (2002) Journal of Applied Physics , vol.91 , pp. 2473-2480
    • Kerr, M.1    Cuevas, A.2
  • 13
    • 0001501824 scopus 로고
    • Ohmic contacts for GaAs devices
    • R. Cox, and H. Strack Ohmic contacts for GaAs devices Solid-State Electronics 10 1967 1215 1218
    • (1967) Solid-State Electronics , vol.10 , pp. 1215-1218
    • Cox, R.1    Strack, H.2
  • 14
    • 0000238429 scopus 로고
    • Intrinsic concentration, eff. densities of states, and eff. mass in silicon
    • M. Green Intrinsic concentration, eff. densities of states, and eff. mass in silicon Journal of Applied Physics 67 1990 2944 2954
    • (1990) Journal of Applied Physics , vol.67 , pp. 2944-2954
    • Green, M.1
  • 16
    • 0014603366 scopus 로고
    • Messung des Übergangswiderstandes zwischen Metall und Diffusionsschicht in Si-Planarelementen
    • H. Murrmann, and D. Widmann Messung des Übergangswiderstandes zwischen Metall und Diffusionsschicht in Si-Planarelementen Solid-State Electronics 12 1969 879 886
    • (1969) Solid-State Electronics , vol.12 , pp. 879-886
    • Murrmann, H.1    Widmann, D.2
  • 18
    • 84866744007 scopus 로고    scopus 로고
    • Simulation tool for equivalent circuit modeling of photovoltaic devices
    • S. Eidelloth, F. Haase, R. Brendel, Simulation tool for equivalent circuit modeling of photovoltaic devices, IEEE Journal of Photovoltaics PP (99) (2012) 1-8, http://dx.doi.org/10.1109/JPHOTOV.2012.2187774.
    • (2012) IEEE Journal of Photovoltaics PP , vol.99 , pp. 1-8
    • Eidelloth, S.1    Haase, F.2    Brendel, R.3
  • 20
    • 36449002905 scopus 로고    scopus 로고
    • Record low surface recombination velocities on 1 Ω cm p-silicon using remote plasma silicon nitride passivation
    • T. Lauinger, J. Schmidt, A. Aberle, and R. Hezel Record low surface recombination velocities on 1 Ω cm p-silicon using remote plasma silicon nitride passivation Applied Physics Letters 68 1996 1232 1234
    • (1996) Applied Physics Letters , vol.68 , pp. 1232-1234
    • Lauinger, T.1    Schmidt, J.2    Aberle, A.3    Hezel, R.4
  • 23
    • 51749093065 scopus 로고    scopus 로고
    • Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera-based approach
    • K. Ramspeck, S. Reissenweber, J. Schmidt, K. Bothe, and R. Brendel Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera- based approach Applied Physics Letters 93 2008 102104-1 102104-3
    • (2008) Applied Physics Letters , vol.93 , pp. 1021041-1021043
    • Ramspeck, K.1    Reissenweber, S.2    Schmidt, J.3    Bothe, K.4    Brendel, R.5
  • 24
    • 78650860740 scopus 로고    scopus 로고
    • Recombination at laser-processed local base contacts by dynamic infrared lifetime mapping
    • J. Müller, K. Bothe, S. Gatz, F. Haase, C. Mader, and R. Brendel Recombination at laser-processed local base contacts by dynamic infrared lifetime mapping Journal of Applied Physics 108 2010 124513-1 124513-6
    • (2010) Journal of Applied Physics , vol.108 , pp. 1245131-1245136
    • Müller, J.1    Bothe, K.2    Gatz, S.3    Haase, F.4    Mader, C.5    Brendel, R.6
  • 25
    • 77951222962 scopus 로고    scopus 로고
    • Charge carrier lifetime degradation in Cz silicon through the formation of a boron-rich layer during BBr3 diffusion processes
    • 10.1088/0268-1242/25/5/055001
    • M. Kessler, T. Ohrdes, B. Wolpensinger, and N. Harder Charge carrier lifetime degradation in Cz silicon through the formation of a boron-rich layer during BBr3 diffusion processes Semiconductor Science and Technology 25 2010 055001-1 055001-9 10.1088/0268-1242/25/5/055001
    • (2010) Semiconductor Science and Technology , vol.25 , pp. 0550011-0550019
    • Kessler, M.1    Ohrdes, T.2    Wolpensinger, B.3    Harder, N.4
  • 26
    • 84861091306 scopus 로고    scopus 로고
    • High-efficiency back-junction silicon solar cell with an in-line evaporated aluminum front grid
    • 19-24 June Seattle, WA, USA
    • M. Kessler, D. Münster, T. Neubert, C. Mader, J. Schmidt, R. Brendel, High-efficiency back-junction silicon solar cell with an in-line evaporated aluminum front grid, in: Proceedings of the 37th IEEE Photovoltaic Specialists Conference, 19-24 June 2011, Seattle, WA, USA, pp. 1085-1090.
    • (2011) Proceedings of the 37th IEEE Photovoltaic Specialists Conference , pp. 1085-1090
    • M. Kessler1
  • 27
    • 79955468972 scopus 로고    scopus 로고
    • Formation of highly aluminum-doped p-type silicon regions by in-line high-rate evaporation
    • C. Mader, R. Bock, J. Schmidt, and R. Brendel Formation of highly aluminum-doped p-type silicon regions by in-line high-rate evaporation Solar Energy Materials and Solar Cells 95 2011 1720 1722
    • (2011) Solar Energy Materials and Solar Cells , vol.95 , pp. 1720-1722
    • Mader, C.1    Bock, R.2    Schmidt, J.3    Brendel, R.4
  • 28
    • 80052083487 scopus 로고    scopus 로고
    • Formation of locally aluminum-doped p-type silicon regions by in-line high-rate evaporation
    • C. Mader, R. Bock, J. Müller, J. Schmidt, and R. Brendel Formation of locally aluminum-doped p-type silicon regions by in-line high-rate evaporation Energy Procedia 8 2011 521 526
    • (2011) Energy Procedia , vol.8 , pp. 521-526
    • Mader, C.1    Bock, R.2    Müller, J.3    Schmidt, J.4    Brendel, R.5
  • 29
    • 0000066852 scopus 로고
    • Sensitivity and transient response of microwave reflection measurements
    • M. Schöfthaler, and R. Brendel Sensitivity and transient response of microwave reflection measurements Journal of Applied Physics 77 1995 3162 3173
    • (1995) Journal of Applied Physics , vol.77 , pp. 3162-3173
    • Schöfthaler, M.1    Brendel, R.2
  • 30
    • 36449001106 scopus 로고
    • Direct observation of a scaling effect on effective minority carrier lifetimes
    • M. Schöfthaler, U. Rau, and J. Werner Direct observation of a scaling effect on effective minority carrier lifetimes Journal of Applied Physics 76 1994 4168 4172
    • (1994) Journal of Applied Physics , vol.76 , pp. 4168-4172
    • Schöfthaler, M.1    Rau, U.2    Werner, J.3
  • 31
    • 0035307668 scopus 로고    scopus 로고
    • Surface recombination velocity of phosphorus-diffused silicon solar cell emitters passivated with plasma enhanced chemical vapor deposited silicon nitride and thermal silicon oxide
    • M. Kerr, J. Schmidt, A. Cuevas, and J. Bultman Surface recombination velocity of phosphorus-diffused silicon solar cell emitters passivated with plasma enhanced chemical vapor deposited silicon nitride and thermal silicon oxide Journal of Applied Physics 89 2001 3821 3826
    • (2001) Journal of Applied Physics , vol.89 , pp. 3821-3826
    • Kerr, M.1    Schmidt, J.2    Cuevas, A.3    Bultman, J.4
  • 33
    • 33748761532 scopus 로고
    • Zur Halbleitertheorie der Sperrschicht-und Spitzengleichrichter
    • W. Schottky Zur Halbleitertheorie der Sperrschicht-und Spitzengleichrichter Zeitschrift für Physik 113 1939 367 414
    • (1939) Zeitschrift für Physik , vol.113 , pp. 367-414
    • Schottky, W.1
  • 34
    • 0014735482 scopus 로고
    • Electron tunneling and contact resistance of metal-silicon contact barriers
    • A. Yu Electron tunneling and contact resistance of metal-silicon contact barriers Solid-State Electronics 13 1970 239 247
    • (1970) Solid-State Electronics , vol.13 , pp. 239-247
    • Yu, A.1
  • 35
    • 0023999216 scopus 로고
    • Specific contact resistivity of metal-semiconductor contacts-A new, accurate method linked to spreading resistance
    • G. Carver, J. Kopanski, D. Novotny, and R. Forman Specific contact resistivity of metal-semiconductor contacts-a new, accurate method linked to spreading resistance EEE Transactions on Electron Devices 35 1988 489 497
    • (1988) EEE Transactions on Electron Devices , vol.35 , pp. 489-497
    • Carver, G.1    Kopanski, J.2    Novotny, D.3    Forman, R.4
  • 36
    • 84867572023 scopus 로고    scopus 로고
    • Contact resistance of local rear side contacts of screen-printed silicon PERC solar cells with efficiencies up to 19.4%
    • 19-24 June Seattle, WA, USA
    • S. Gatz, T: Dullweber, R. Brendel, Contact resistance of local rear side contacts of screen-printed silicon PERC solar cells with efficiencies up to 19.4%, in: Proceedings of the 37th IEEE Photovoltaic Specialists Conference, 19-24 June 2011, Seattle, WA, USA, pp. 3658-3664.
    • (2011) Proceedings of the 37th IEEE Photovoltaic Specialists Conference , pp. 3658-3664
    • S. Gatz, T.1    Dullweber R. Brendel2
  • 38
    • 78650885118 scopus 로고    scopus 로고
    • Comprehensive analytical model for locally contacted rear surface passivated solar cells
    • A. Wolf, D. Biro, J. Nekarda, S. Stumpp, A. Kimmerle, A. Mack, and R. Preu Comprehensive analytical model for locally contacted rear surface passivated solar cells Journal of Applied Physics 108 2010 124510-1 124510-13
    • (2010) Journal of Applied Physics , vol.108 , pp. 1245101-12451013
    • Wolf, A.1    Biro, D.2    Nekarda, J.3    Stumpp, S.4    Kimmerle, A.5    MacK, A.6    Preu, R.7
  • 39
    • 0015973475 scopus 로고
    • Investigation of photon and thermal induced changes in silicon solar cells
    • 13-15 November Palo Alto, CA, USA
    • H. Fischer, W. Pschunder, Investigation of photon and thermal induced changes in silicon solar cells, in: Proceedings of the 10th IEEE Photovoltaic Specialists Conference, 13-15 November 1973, Palo Alto, CA, USA, pp. 404-411.
    • (1973) Proceedings of the 10th IEEE Photovoltaic Specialists Conference , pp. 404-411
    • Fischer, H.1    Pschunder, W.2
  • 40
    • 20444401538 scopus 로고    scopus 로고
    • Fundamental boron-oxygen related carrier lifetime limit in mono- and multicrystalline silicon
    • K. Bothe, R. Sinton, and J. Schmidt Fundamental boron-oxygen related carrier lifetime limit in mono- and multicrystalline silicon Progress in Photovoltaics: Research and Applications 13 2005 287 296
    • (2005) Progress in Photovoltaics: Research and Applications , vol.13 , pp. 287-296
    • Bothe, K.1    Sinton, R.2    Schmidt, J.3
  • 42
    • 54949141878 scopus 로고    scopus 로고
    • Deactivation of the boron-oxygen recombination center in silicon by illumination at elevated temperature
    • B. Lim, K. Bothe, and J. Schmidt Deactivation of the boron-oxygen recombination center in silicon by illumination at elevated temperature Physica Status Solidi (RRL) 2 3 2008 93 95
    • (2008) Physica Status Solidi (RRL) , vol.2 , Issue.3 , pp. 93-95
    • Lim, B.1    Bothe, K.2    Schmidt, J.3
  • 45
    • 0001672081 scopus 로고
    • Models for contacts to planar devices
    • H. Berger Models for contacts to planar devices Solid-State Electronics 15 1972 145 158
    • (1972) Solid-State Electronics , vol.15 , pp. 145-158
    • Berger, H.1
  • 46
    • 25144504270 scopus 로고    scopus 로고
    • Laser-fired contact silicon solar cells on p- and n-substrates
    • 7-11 June Paris, France
    • S. Glunz, E. Schneiderlöchner, D. Kray, A. Grohe, M. Hermle, H. Kampwerth, R. Preu, G. Willeke, Laser-fired contact silicon solar cells on p- and n-substrates, in: Proceedings of the 19th European Photovoltaic Solar Energy Conference, 7-11 June 2004, Paris, France, pp. 408-411.
    • (2004) Proceedings of the 19th European Photovoltaic Solar Energy Conference , pp. 408-411
    • S. Glunz1
  • 48
    • 67651093939 scopus 로고    scopus 로고
    • Optimization of the back contact in c-Si solar cells
    • S. Yang, and J. Pla Optimization of the back contact in c-Si solar cells Solid-State Electronics 53 2009 925 930
    • (2009) Solid-State Electronics , vol.53 , pp. 925-930
    • Yang, S.1    Pla, J.2
  • 50
    • 0028098407 scopus 로고
    • Series resistance caused by the localized rear contact in high efficiency silicon solar cells
    • J. Zhao, A. Wang, and M. Green Series resistance caused by the localized rear contact in high efficiency silicon solar cells Solar Energy Materials and Solar Cells 32 1994 89 94
    • (1994) Solar Energy Materials and Solar Cells , vol.32 , pp. 89-94
    • Zhao, J.1    Wang, A.2    Green, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.