Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera-based approach

Applied Physics Letters

Volumn 93, Issue 10, 2008, Pages

  Ramspeck, K ^a   Reissenweber, S ^a   Schmidt, J ^a   Bothe, K ^a   Brendel, R ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CIVIL AVIATION; IMAGE ENHANCEMENT; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON;

INFRA-RED EMISSION; LIFETIME MAPPING; MONOCHROMATIC ILLUMINATION; SIGNAL RATIOS;

CARRIER LIFETIME;

EID: 51749093065     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2972122     Document Type: Article

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