Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide

Progress in Photovoltaics: Research and Applications

Volumn 8, Issue 5, 2000, Pages 529-536

  Kerr, Mark ^a   Schmidt, Jan ^a   Cuevas, Andres ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; PASSIVATION; PHOTOLITHOGRAPHY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICA; SILICON NITRIDE; VOLTAGE MEASUREMENT;

CONVERSION EFFICIENCY; OPEN CIRCUIT VOLTAGE;

SILICON SOLAR CELLS;

EID: 0034268274     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-159X(200009/10)8:5<529::AID-PIP334>3.0.CO;2-6     Document Type: Article

References (15)

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