Rear-side point-contacts by inline thermal evaporation of aluminum

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 1446-1449

  Mader, Christoph ^a   Müller, Jens ^a   Gatz, Sebastian ^a   Dullweber, Thorsten ^a   Brendel, Rolf ^a,b  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING DENSITIES; EFFECTIVE LIFETIME; IN-LINE; LIFETIME MAPPING; METALLIZATIONS; P-TYPE SILICON; PASSIVATION LAYER; SCREEN-PRINTED; SPECIFIC CONTACT RESISTANCES;

ALUMINUM; CONVERSION EFFICIENCY; ENERGY CONVERSION; METALLIZING; PASSIVATION; PHOTOVOLTAIC EFFECTS; SILICON NITRIDE; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR ENERGY; THERMAL EVAPORATION;

ALUMINUM COATINGS;

EID: 78650120911     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614430     Document Type: Conference Paper

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