Low temperature response of nanostructured tungsten oxide thin films toward hydrogen and ethanol

Sensors and Actuators, B: Chemical

Volumn 173, Issue , 2012, Pages 789-796

  Ahsan, M ^a   Ahmad, M Z ^b   Tesfamichael, T ^a   Bell, J ^a   Wlodarski, W ^b   Motta, N ^a  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^b RMIT UNIVERSITY   (Australia)

Author keywords

Gas sensing; Nanostructured; Thermal evaporation; Thin films; Tungsten oxide

Indexed keywords

AFM; ANALYTICAL TECHNIQUES; AS-DEPOSITED FILMS; CRYSTALLINE PROPERTIES; CRYSTALLINITIES; GAS SENSING; LOW OPERATING TEMPERATURE; LOW TEMPERATURES; NANO-STRUCTURED; SEMICONDUCTING METAL OXIDES; TEMPERATURE RANGE; THERMAL EVAPORATION METHOD; TUNGSTEN OXIDE; TUNGSTEN OXIDE THIN FILMS; XPS ANALYSIS; XRD; XRD ANALYSIS;

ANNEALING; CHEMICAL DETECTION; CHEMICAL SENSORS; DEPOSITS; ETHANOL; GAS DETECTORS; HYDROGEN; NANOSTRUCTURES; OXIDES; RAMAN SPECTROSCOPY; STOICHIOMETRY; TEMPERATURE; THERMAL EVAPORATION; THIN FILMS; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS FILMS;

EID: 84867040677     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2012.07.108     Document Type: Article

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