STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films

Surface Science

Volumn 601, Issue 21, 2007, Pages 4953-4957

  Maffeis, T G G ^a   Yung, D ^a   LePennec, L ^a   Penny, M W ^a   Cobley, R J ^a   Comini, E ^b   Sberveglieri, G ^b   Wilks, S P ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

^b INFM   (Italy)

Author keywords

Polycrystalline surfaces; Polycrystalline thin films; Scanning tunnelling microscopy; Surface structure, morphology, roughness, and topography; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

NANOCRYSTALLINE MATERIALS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYCRYSTALLINE SURFACES; POLYCRYSTALLINE THIN FILMS; TUNGSTEN OXIDE;

THIN FILMS;

EID: 35448997797     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.08.009     Document Type: Article

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