Structural and optical characterization of amorphous and crystalline evaporated WO3 layers

Thin Solid Films

Volumn 354, Issue 1, 1999, Pages 73-81

  Antonaia, A ^a   Polichetti, T ^a   Addonizio, M L ^a   Aprea, S ^a   Minarini, C ^a   Rubino, A ^a  

^a ENEA CR Portici   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; ELECTROCHROMISM; ELECTRON SCATTERING; ELECTRON TRANSITIONS; EVAPORATION; HYDROGEN; NANOSTRUCTURED MATERIALS; OXIDATION; POSITIVE IONS; TUNGSTEN COMPOUNDS;

FREE ELECTRON SCATTERING;

AMORPHOUS FILMS;

EID: 0033359717     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00567-2     Document Type: Article

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