Charge carrier dynamics and interactions in electric force microscopy

Journal of Chemical Physics

Volumn 137, Issue 12, 2012, Pages

  Lekkala, Swapna ^a   Hoepker, Nikolas ^b   Marohn, John A ^a   Loring, Roger F ^a  

^a Department of Obstetrics Gynecology   (United States)

^b Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CHARGE CARRIER DYNAMICS; CLASSICAL ELECTRODYNAMICS; DIELECTRIC FLUCTUATIONS; ELECTRICAL FORCE; ELECTRICAL NOISE; FREQUENCY FLUCTUATION; FREQUENCY NOISE; IN-VACUUM; ORDERS OF MAGNITUDE;

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; ELECTRIC FORCE MICROSCOPY; ELECTRIC GENERATORS; NANOCANTILEVERS; ORGANIC FIELD EFFECT TRANSISTORS; SEMICONDUCTOR DEVICES;

ELECTRIC FIELD EFFECTS;

EID: 84867025279     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4754602     Document Type: Article

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