Dielectric fluctuations over polymer films detected using an atomic force microscope

Journal of Physical Chemistry B

Volumn 115, Issue 49, 2011, Pages 14493-14500

  Hoepker, Nikolas ^a   Lekkala, Swapna ^b   Loring, Roger F ^b   Marohn, John A ^b  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; MICROSCOPES; NANOCANTILEVERS; POLYVINYL ACETATES; SEPARATION; SURFACES; VIBRATIONS (MECHANICAL);

APPLIED VOLTAGES; ATOMIC FORCE MICROSCOPE CANTILEVERS; ATOMIC FORCE MICROSCOPES; DIELECTRIC FLUCTUATIONS; ELECTRIC FIELD GRADIENTS; FILM SURFACES; FREQUENCY NOISE; LINEAR-RESPONSE THEORY; MOLECULAR INFORMATION; MOLECULAR MATERIALS; ORIENTATIONAL RELAXATION; POLAR POLYMERS; SYSTEMATIC STUDY; ULTRASENSITIVE;

POLYMER FILMS;

EID: 83455219414     PISSN: 15206106     EISSN: 15205207     Source Type: Journal    
DOI: 10.1021/jp207387d     Document Type: Article

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