Atomic force measurement of low-frequency dielectric noise

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3223-3225

  Walther, L E ^a   Vidal Russell, E ^a   Israeloff, N E ^a   Gomariz, H Alvarez ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006696945     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121556     Document Type: Article

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