Noncontact dielectric friction

Journal of Physical Chemistry B

Volumn 110, Issue 30, 2006, Pages 14525-14528

  Kuehn, Seppe ^a   Marohn, John A ^a   Loring, Roger F ^a  

^a Department of Population Medicine and Diagnostic Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; ELECTRIC FIELD EFFECTS; POLYMETHYL METHACRYLATES; SENSITIVITY ANALYSIS; SILICON; SINGLE CRYSTALS; THIN FILMS;

DIELECTRIC FLUCTUATIONS; ELECTRIC FIELD FLUCTUATIONS; SCANNING PROBE MICROSCOPY; SILICON CANTILEVERS;

FRICTION;

EID: 33748324600     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp061865n     Document Type: Article

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