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Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 11, 2012, Pages

Inhomogeneous strain in GaN nanowires determined from x-ray diffraction peak profiles

(7) Kaganer, V M a Jenichen, B a Brandt, O a Fernandez Garrido S a Dogan, P a Geelhaar, L a Riechert, H a

a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866991016 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.86.115325 Document Type: Article

Times cited : (30)

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