Multiscale measurements of residual strains in a stabilized zirconia layer

Journal of Applied Crystallography

Volumn 45, Issue 5, 2012, Pages 926-935

  Villanova, Julie ^a   Maurice, Claire ^b   Micha, Jean Sébastien ^c   Bleuet, Pierre ^d   Sicardy, Olivier ^c   Fortunier, Roland ^e  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b LCG   (France)

^c CEA GRENOBLE   (France)

^d CEA LETI   (France)

^e UNIVERSITÉ DE LYON   (France)

Author keywords

electron backscatter diffraction; residual stresses; solid oxide fuel cells; strain; X ray synchrotron radiation; zirconia

Indexed keywords

BIAXIAL COMPRESSION; DIFFERENT LENGTH SCALE; ELECTRON BACK SCATTER DIFFRACTION; GRAIN ORIENTATION; HIGH RESOLUTION; MACROSCOPIC MEASUREMENTS; MULTISCALES; QUANTITATIVE VALUES; RESIDUAL STRAINS; STABILIZED ZIRCONIA; STRAIN VARIATION; THREE DIFFERENT TECHNIQUES; X RAY MICRODIFFRACTION; X-RAY SYNCHROTRON RADIATION;

ELECTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SOLID OXIDE FUEL CELLS (SOFC); STRAIN; SYNCHROTRON RADIATION; X RAY DIFFRACTION; ZIRCONIA;

YTTRIA STABILIZED ZIRCONIA;

EID: 84866553717     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812028427     Document Type: Article

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