Quantitative texture analysis of polycrystalline ferroelectrics

Springer Series in Materials Science

Volumn 140, Issue 1, 2011, Pages 347-408

  Chateigner, D ^a   Ricote, J ^b  

^a LABORATOIRE CRISMAT   (France)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866435963     PISSN: 0933033X     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-90-481-2875-4_8     Document Type: Article

References (77)

1. Scott J.F. (2000) Ferroelectric Memories. Springer Series in Advanced Microelectronics 3, Springer-Verlag, Berlin-Heidelberg.
2. Arimoto Y., Ishiwara H. (2004) Current status of ferroelectric random-access memory. MRS Bull. 29: 823-828.
3. 3 thin films: Integration and application issues. In: N. Setter (Ed.) Piezoelectric Materials in Devices, EPFL Swiss Federal Institute of Technology, Lausanne, pp. 231-260.
4. Wouters D.J., Willems G., Lee E.U., Maes H.E. (1997) Elucidation of the switching processes in tetragonal PZT by hysteresis loop and impedance analysis. Integr. Ferroelectr. 15:79-87.
5. 3 thin film prepared by chemical solution deposition. J. Mater. Res. 13:2206-2217.
6. 3 thin films on ferroelectric properties. Thin Solid Films 416:264-270.
7. Bouregba R., Poullain G., Vilquin B., Murray H. (2000) Orientation control of textured PZT thin films sputtered on silicon substrate with TiOx seeding. Mater. Res. Bull. 35:1381-1390.
8. Randle V., Engler O. (2000) Introduction to texture analysis. Macrotexture, microtexture and orientation mapping. CRC Press, Boca Raton, Florida.
9. Brentano J.C.M. (1946) Parafocusing properties of microcrystalline powder layers in xray diffraction applied to the design of x-ray goniometers. J. Appl. Phys. 17:420-434.
10. Wcislak L., Bunge H.J., Nauer-Gerhardt C.U. (1993) X-ray diffraction texture analysis with a position sensitive detector. Zeitschrift für Metallkunde 84: 479-493.
11. Heizmann J.J., Laruelle C. (1986) Simultaneous measurement of several x-ray pole figures. J. App. Cryst. 19:467-472.
12. 3 single crystal. J. Eur. Ceram. Soc. 19: 1379-1381.
13. Lotgering F.K. (1959) Topotactical reactions with ferrimagnetic oxides having hexagonal crystal structures-I. J. Inorg. Nucl. Chem. 9:113-123.
14. Jones J.L., Slamovich E.B., Bowman K.J. (2004) Critical evaluation of the Lotgering degree of orientation texture indicator. J. Mater. Res. 19: 3414-3422.
15. Brosnan K.H., Messing G.L., Meyer Jr. R.J., Vaudin M.D. (2006) Texture measurements in fiber oriented PMN-PT. J. Amer. Ceram. Soc. 89 1965-1971.
16. O'Connor B.H., Li D.Y., Sitepu H. (1991) Strategies for preferred orientation corrections in x-ray powder diffraction using line intensity ratios. Advances in X-ray Analysis 34 409-415.
17. Capkova P., Peschar R., Schenk H. (1993) Partial multiplicity factors for texture correction of cubic structures in the disc-shaped crystallite model. J. Appl. Cryst. 26:449-452.
18. Cerny R, Valvoda V., Cladek M. (1995) Empirical texture corrections for asymmetric diffraction and inclined textures. J. Appl. Cryst. 28:247-253.
19. O'Connor B.H., Li D.Y., Sitepu H. (1992) Texture characterization in x-ray powder diffraction using the March formula. /Advances in X-ray Analysis. Advances in X-ray Analysis 35:277-283.
20. Pernet M., Chateigner D., Germi P., Dubourdieu C., Thomas O., Sénateur J.-P., Chambonnet D., Belouet C. (1994) Texture influence on critical current density of YBCO films deposited on (100)-MgO substrates. Physica C 235-240:627-628.
21. Isaure M.-P., Laboudigue A., Manceau A., Sarret G., Tiffreau C., Trocellier P., Lamble G., Hazemann J.-L., Chateigner D. (2002) Quantitative Zn speciation in a contaminated dredgeg sediment by μ-PIXE, μ-EXAFS spectroscopy and principal component analysis. Geochimica et Cosmochimica Acta 66:1549-1567.
22. th International Conference on Textures of Materials. Vol. 2. Int. Academic Publishers, pp. 1221-1226.
23. Bunge H.J., Esling, C. (eds) (1982) Quantitative Texture Analysis. DGM, Germany.
24. Bunge H.J. (1982) Texture Analysis in Materials Science. P.R. Morris Trans., Butterworths, London.
25. Matthies S. (1979) Reproducibility of the orientation distribution function of texture samples from pole figures (ghost phenomena). Physica Status Solidi B 92:K135-K138.
26. Ruer D. (1976) Méthode vectorielle d'analyse de la texture. PhD thesis, Université de Metz, France.
27. Vadon A. (1981) Généralisation et optimisation de la méthode vectorielle d'analyse de la texture. PhD thesis, Université de Metz, France.
28. Schaeben H. (1988) Entropy optimization in quantitative texture analysis. J. Appl. Phys. 64:2236-2237.
29. Helming K. (1998) Texture approximations by model components. Materials Structure 5:3-9.
30. Pawlik K. (1993) Application of the ADC method for ODF approximation in cases of low crystal and sample symmetries. Mater. Sci. Forum 133-136:151-156.
31. Williams R.O. (1968) Analytical methods for representing complex textures by biaxial pole figures. J. Appl. Phys. 39:4329-4335.
32. Imhof J. (1982) The resolution of orientation space with reference to pole figure resolution. Textures and Microstructures 4:189-200.
33. Matthies S., Vinel G.W. (1982) On the reproduction of the orientation distribution function of texturized samples from reduced pole figures using the conception of a conditional ghost correction. Physica Status Solidi B 112:K111-K114.
34. Schaeben H. (1991) Determination of complete ODF using the maximum entropy method. In Bunge H.J., Esling C. (eds) Advances and applications of quantitative texture analysis. DGM, Oberursel, Germany, pp109-118.
35. 3. Ferroelectrics 267:323-328.
36. Morales M., Chateigner D., Lutterotti L., Ricote J. (2002) X-ray combined QTA using a CPS applied to a ferroelectric ultrastructure. Mater. Sci. Forum 408-412:1055-1060.
37. Lutterotti L., Chateigner D., Ferrari S., Ricote J. (2004) Texture, residual stress and structural analysis of thin films using a combined X-ray analysis. Thin Solid Films 450:34-41.
38. Ricote J., Chateigner D. (2004) Quantitative microstructural and texture characterization by X-ray diffraction of polycrystalline ferroelectric thin films. J. Appl. Cryst. 37:91-95.
39. Ricote J., Chateigner D., Morales M., Calzada M.L., Wiemer C. (2004) Application of the X-ray combined analysis to the study of lead titanate based ferroelectric thin films. Thin Solid Films 450:128-133.
40. Chateigner D. (2005) Reliability criteria in Quantitative Texture Analysis with Experimental and Simulated Orientation Distributions. J. Appl. Cryst. 38:603-611.
41. Chateigner D. (2002) POFINT: a MS-DOS program for Pole Figure Interpretation. http://www.ecole.ensicaen.fr/~chateign/qta/pofint/.
42. Wenk H.R., Matthies S., Donovan J., Chateigner D. (1998) BEARTEX: a Windowsbased program system for quantitative texture analysis. J. Appl. Cryst. 31:262-269.
43. Lutterotti L., Matthies S., Wenk H.-R. (1999). MAUD (Material Analysis Using Diffraction): a user friendly Java program for Rietveld texture analysis and more. National Research Council of Canada, Ottawa 1999, 1599-1604. http://www.ing.unitn.it/~luttero/maud/.
44. Matthies S., Humbert M. (1995) The combination of thermal analysis and time-resolved X-ray techniques: a powerful method for materials characterization. J. Appl. Cryst. 28:31-42.
45. Chateigner D. (ed) (2004) Combined analysis: structure-texture-microstructure-phasestresses-reflectivity analysis by x-ray and neutron scattering. To appear ISTE. http://www.ecole.ensicaen.fr/~chateign/texture/combined.pdf.
46. Ricote J., Chateigner D., Algueró M. (2005) Intrinsic effective elastic tensor of ferroelectric polycrystalline lead titanate based thin films with fiber-type texture. Thin Solid Films 491:137-142.
47. Chateigner D., Lutterotti L., Hansen T. (1998) Quantitative phase and texture analysis on ceramics-matrix composites using Rietveld texture analysis. ILL Highlights 1997 28-29.
48. Lutterotti L., Matthies S., Chateigner D., Ferrari S., Ricote J. (2002) Rietveld texture and stress analysis of thin films by X-ray diffraction. Mater. Sci. Forum 408-412:1603-1608.
49. Ricote J., Poyato R., Algueró M., Pardo L., Calzada M.L., Chateigner D. (2003) Texture development in modified lead titanate thin films obtained by chemical solution deposition on silicon-based substrates. J. Am. Ceram. Soc. 86:1571-1577.
50. Ricote J., Chateigner D. (1999) Quantitative texture analysis applied to the study of preferential orientations in ferroelectric thin films. Bol. Soc. Esp. Cerám. Vidrio. 38:587-591.
51. Ricote J., Chateigner D., Pardo L., Algueró M., Mendiola J., Calzada M.L. (2000) Quantitative analysis of preferential orientation components of ferroelectric thin films. Ferroelectrics 241:167-174.
52. Swanson T (1953). Natl. Bur. Stand. (U.S.), Circ. 539, I, 31. (JCPDS file 04-0802).
53. Mendiola J., Jiménez B., Alemany C., Pardo L, Del Olmo, L. (1989) Influence of calcium on the ferroelectricity of modified lead titanate ceramics. Ferroelectrics 94:183-188.
54. 3 by metalorganic chemical-vapor deposition. J. Appl. Phys. 78:2607-2622.
55. Ricote J., Chateigner D., Calzada M.L., Mendiola J. (2002) Preferential orientation of ferroelectric calcium modified lead titanate thin films grown on various substrates. Bol. Soc. Esp. Cerám. Vidrio 41:80-84.
56. 9 composites. Appl. Phys. Lett. 85:1490-1492.
57. 3 by metalorganic chemical-vapour deposition. J. Appl. Phys. 78:2607-2622.
58. Hsu W.Y., Raj R. (1995) X-ray characterization of the domain structure of epitaxial lead titanate thin films on (001) strontium titanate. Appl. Phys. Lett. 67:792-794.
59. Foster C.M., Pompe W., Daykin A.C., Speck J.S. (1995) Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films. J. Appl. Phys. 79:1405-1415.
60. Speck J.S., Daykin A.C., Seifert A. (1995) Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. III. Interfacial defects and domain misorientations. J. Appl. Phys. 78:1696-1706.
61. 3 thin films. Appl. Surf. Sci. 255:4293.
62. Vilquin B., Le Rhun G., Bouregba R., Poullain G., Murray H. (2002) Effect of in situ Pt bottom electrode deposition and of Pt top electrode preparation on PZT thin films properties. Appl. Surf. Sci. 195:63-73.
63. Leclerc G., Domenges B., Poullain G., Bouregba R. (2006) Elaboration of (111) oriented La-doped PZT thin films on platinized silicon substrates. Appl. Surf. Sci. 253:1143-1149.
64. Huang Z., Todd M.A., Watton R., Whatmore R.W. (1998) Sputtered lead scandium tantalite thin films: a microstructural study. J. Mater. Sci. 33:363-370.
65. Bornand V., Chateigner D., Papet P., Philippot E. (1997). Piezoelectric thin films obtained by pyrosol process. Ann. Chim. Sci. Mat. 22: 683-686.
66. 3 Thin Films for SAW properties. Mater. Sci. Forum 408-412:1573-1578.
67. Smith D.L. (1995) Thin film deposition principles and practice. McGraw Hill, New York, pp. 327-380.
68. Fork D.K., Armani-Leplingard F., Kingston J.J., Anderson G.B. (1985) Thin Film Epitaxial. Oxide Optical Waveguides. Mater. Res. Symp. Proc. 392:189-200.
69. 3 thin films. J. Mater. Res. 12:1391-1400.
70. Guo J., Ellis D.E., Lam D.J. (1992) Electronic structure and energetics of sapphire (0001) and (1-102) surfaces. Phys. Rev. B 45:13647-13656.
71. 2 layer. Mater. Sci. Forum 408-412:1543-1548.
72. 3 thin films: I. Role of Pb-rich intermediate phases. J. Am. Ceram. Soc. 77:2332-2336.
73. Z. Huang, Q. Zhang and R.W. Whatmore (1999) Structural development in the early stages of annealing of sol-gel prepared lead zirconate titanate thin films. J. Appl. Phys. 86:1662-69.
74. 3, x=0.4) thin films. J. Am. Ceram. Soc. 79:495-98.
75. 2 seeding. J. Appl. Phys. 83:3835-3841.
76. 3 buffer layers produced by magnetron sputtering. Appl. Phys. Lett. 70:1718-1720.
77. Calzada M.L., Poyato R., García López J., Respaldiza M.A., Ricote J., Pardo L. (2001) Effect of the substrate heterostructure on the texture of lanthanum modified lead titanate thin films. J. Eur. Ceram. Soc. 21:1529-1533.