Sputtered lead scandium tantalate thin films: A microstructural study

Journal of Materials Science

Volumn 33, Issue 2, 1998, Pages 363-370

  Huang, Z ^a,c   Todd, M A ^b   Watton, R ^b   Whatmore, R W ^c  

^a UNIVERSITY OF ESSEX   (United Kingdom)

^b DRA   (United Kingdom)

^c CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEPOSITION; ELECTRIC LOSSES; GRAIN BOUNDARIES; LEAD COMPOUNDS; MAGNESIA; PERMITTIVITY MEASUREMENT; PEROVSKITE; SILICON; SUBSTRATES; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS; LEAD SCANDIUM TANTALATE; MICROBEAM DIFFRACTION; PYROCHLORE;

DIELECTRIC FILMS;

EID: 0031671952     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004367712774     Document Type: Article

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