Combined X-ray texture-structure-microstructure analysis applied to ferroelectric ultrastructures: A case study on Pb0.76Ca 0.24TiO3

Ferroelectrics

Volumn 267, Issue , 2002, Pages 323-328

  Cont, L ^a,b   Chateigner, D ^a,d   Lutterotti, L ^b   Ricote, J ^c   Calzada, M L ^c   Mendiola, J ^c  

^a UNIVERSITÉ DU MAINE   (France)

^b UNIVERSITY OF TRENTO   (Italy)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^d LABORATOIRE CRISMAT   (France)

Author keywords

Ferroelectric thin films; Modified lead titanates; Structure; Texture; X Ray diffraction combined approach

Indexed keywords

ELECTRODES; FERROELECTRIC THIN FILMS; LEAD COMPOUNDS; PLATINUM; TEXTURES; X RAY DIFFRACTION ANALYSIS;

MICROSTRAIN STATE; MODIFIED LEAD TITANATES; X-RAY DIFFRACTION COMBINED APPROACH;

MICROSTRUCTURE;

EID: 1242297427     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190211032     Document Type: Conference Paper

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