Determination of complex refractive index of thin metal films from terahertz time-domain spectroscopy

Journal of Applied Physics

Volumn 104, Issue 5, 2008, Pages

  Zhou, Da Xiang ^a   Parrott, E P J ^a   Paul, Douglas J ^b   Zeitler, J Axel ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; CHLORINE COMPOUNDS; DIELECTRIC FILMS; FOURIER TRANSFORMS; LIGHT REFRACTION; MATHEMATICAL TRANSFORMATIONS; METALLIC FILMS; METALS; METHOD OF MOMENTS; MODEL STRUCTURES; MULTILAYER FILMS; OPTICAL PROPERTIES; OPTIMIZATION; PLASMA DIAGNOSTICS; PLASMONS; REFLECTOMETERS; REFRACTIVE INDEX; REFRACTOMETERS; SPECTROPHOTOMETERS; STRUCTURAL OPTIMIZATION; TIME DOMAIN ANALYSIS;

COMPLEX REFRACTIVE INDEX; DESIGN AND OPTIMIZATION; EXTRACTION METHODS; EXTRACTION PROCESSING; FREQUENCY RANGING; METAL FILMS; MICRO-BOLOMETER; MICROBOLOMETERS; MULTILAYER STACKING; NOVEL METHODS; RESPONSIVITY; SCATTERING MATRICES; TERAHERTZ; TERAHERTZ FREQUENCY RANGE; TERAHERTZ TIME-DOMAIN SPECTROSCOPY; THEORETICAL CALCULATIONS; THIN METAL FILMS; TIME-DOMAIN TRANSMISSION; TRANSMISSION SPECTRUMS;

METAL RECOVERY;

EID: 51849108096     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2970161     Document Type: Article

References (26)

1. L. N. Hadley and D. M. Dennison, J. Opt. Soc. Am. 37, 451 (1947). 0030-3941
2. P. A. Silberg, J. Opt. Soc. Am. 47, 575 (1957). 0030-3941
3. A. Hadni and X. Gerbaux, Infrared Phys. 0020-0891 10.1016/0020-0891(90) 90014-M 30, 465 (1990).
4. A. D. Parsons and D. J. Pedder, J. Vac. Sci. Technol. A 0734-2101 6, 1688 (1988).
5. S. Bauer, S. Bauer-Gogonea, and B. Ploss, Appl. Phys. B: Photophys. Laser Chem. 0721-7269 10.1007/BF00325524 54, 544 (1992).
6. J. J. Monzon and L. L. Sanchez-Soto, Appl. Opt. 33, 5137 (1994). 0003-6935
7. B. Carli and D. Iorio-Fili, J. Opt. Soc. Am. 71, 1020 (1981). 0030-3941
8. C. A. Schmuttenmaer, Chem. Rev. (Washington, D.C.) 0009-2665 10.1021/cr020685g 104, 1759 (2004).
9. M. Van Exter and D. Grischkowsky, Appl. Phys. Lett. 0003-6951 10.1063/1.103120 56, 1694 (1990).
10. J. F. Whitaker, F. Gao, and Y. Liu, Proc. SPIE 0277-786X 10.1117/12.177140 2145, 168 (1994).
11. D. Grischkowsky, S. Keiding, M. Van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990). 0740-3224
12. S. R. Keiding, J. Phys. Chem. A 1089-5639 10.1021/jp970605q 101, 5250 (1997).
13. J. A. Zeitler, P. F. Taday, D. A. Newnham, M. Pepper, K. C. Gordon, and T. Rades, J. Pharm. Pharmacol. 0373-1022 10.1211/jpp.59.2.0008 59, 209 (2007).
14. J. Pedersen and S. Keiding, IEEE J. Quantum Electron. 0018-9197 10.1109/3.159558 28, 2518 (1992).
15. L. Duvillaret, F. Garet, and J.-L. Coutaz, IEEE J. Sel. Top. Quantum Electron. 2, 739 (1996).
16. W. H. Press, B. P. Flannery, S. A. Teukolsky, and W. T. Vetterling, Numerical Recipes in C++ (Cambridge University Press, Cambridge, England, 2002).
17. J. A. Ward, J. ACM 4, 148 (1957).
18. M. Onoe, Commun. ACM, 5, 398 (1962).
19. Y. C. Shen, P. C. Upadhya, A. G. Davies, and E. H. Linfield, J. Biol. Phys. 29, 135 (2003). 0092-0606
20. Q. Wu and X. -C. Zhang, Appl. Phys. Lett. 0003-6951 10.1063/1.118691 70, 1784 (1997).
21. N. F. Mott, Metal Insulator Transitions (Taylor & Francis, London, 1990).
22. O. S. Heavens, Rep. Prog. Phys. 0034-4885 10.1088/0034-4885/23/1/301 23, 1 (1960).
23. S. Bauer, Am. J. Phys. 0002-9505 10.1119/1.16906 60, 257 (1992).
24. Y. Yagil, P. Gadenne, C. Julien, and G. Deutscher, Phys. Rev. B 0163-1829 10.1103/PhysRevB.46.2503 46, 2503 (1992).
25. Y. Yagil, M. Yosefin, D. J. Bergman, G. Deutscher, and P. Gadenne, Phys. Rev. B 0163-1829 10.1103/PhysRevB.43.11342 43, 11342 (1991).
26. K. Seeger, Semiconductor Physics: An Introduction, 9th ed. (Springer-Verlag, Heidelberg, 2004).