Elimination of high transient currents and electrode damage during electroformation of TiO 2-based resistive switching devices

Journal of Physics D: Applied Physics

Volumn 45, Issue 39, 2012, Pages

  Lu, Yi Meng ^a   Noman, Mohammad ^a   Chen, Wenhao ^a   Salvador, Paul A ^a   Bain, James A ^a   Skowronski, Marek ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE DISCHARGES; ELECTROFORMATIONS; EXTERNAL RESISTORS; PHYSICAL CHANGES; PHYSICAL DAMAGES; RESISTIVE SWITCHING; SETPOINTS; SOURCE METER; SWITCHING CHARACTERISTICS; TIO; TRANSIENT CURRENT;

ELECTRIC FAULT CURRENTS; ELECTROFORMING; SCANNING ELECTRON MICROSCOPY; SWITCHING SYSTEMS; TITANIUM DIOXIDE;

ELECTRIC DISCHARGES;

EID: 84866407362     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/39/395101     Document Type: Article

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