Structural, dielectric, ferroelectric and piezoresponse force microscopy characterizations of bilayered Bi 0.9Dy 0.1FeO 3/K 0.5Na 0.5NbO 3 lead-free multiferroic films

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Chen, Ling ^a,b   Ren, Wei ^a   Ye, Zuo Guang ^a,b   Tian, Aifen ^a   Wu, Xiaoqing ^a   Shi, Peng ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BILAYERED FILMS; DIELECTRIC AND FERROELECTRIC PROPERTIES; DIFFERENT THICKNESS; DOMAIN STRUCTURE; LEAD-FREE; LEAD-FREE THIN FILM; MULTIFERROIC FILM; PIEZORESPONSE FORCE MICROSCOPY; THICKNESS RATIO;

ELECTRIC FIELDS; FERROELECTRICITY; IRON OXIDES; NIOBIUM OXIDE; POLARIZATION; PULSED LASER DEPOSITION; SODIUM;

COMPOSITE FILMS;

EID: 84866378545     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4746086     Document Type: Conference Paper

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