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Volumn 7, Issue , 2012, Pages 1-6

Nanoindentation of GaSe thin films

Author keywords

GaSe thin films; Hardness; Nanoindentation; XRD

Indexed keywords

CONTINUOUS STIFFNESS MEASUREMENT; LOAD-DISPLACEMENT CURVE; NANOINDENTATION TECHNIQUES; NANOMECHANICAL PROPERTY; SI(111) SUBSTRATE; XRD; XRD PATTERNS; YOUNG'S MODULUS;

EID: 84866128385     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-7-403     Document Type: Article
Times cited : (16)

References (30)
  • 1
    • 0011058280 scopus 로고
    • Photoelectronic and optical properties of amorphous gallium-selenide thin films
    • Giulio MD, Micocci G, Sililiano P, Tepore A: Photoelectronic and optical properties of amorphous gallium-selenide thin films. J Appl Phys 1987, 62:4231.
    • (1987) J Appl Phys , vol.62 , pp. 4231
    • Giulio, M.D.1    Micocci, G.2    Sililiano, P.3    Tepore, A.4
  • 3
    • 62549088661 scopus 로고    scopus 로고
    • The structural and material properties of CuInSe2 and Cu(In, Ga)Se-2 prepared by selenization of stacks of metal and compound precursors by Se vapor for solar cell applications
    • Dejene FB: The structural and material properties of CuInSe2 and Cu(In, Ga)Se-2 prepared by selenization of stacks of metal and compound precursors by Se vapor for solar cell applications. Sol Energy Mater Sol Cells 2009, 93:577.
    • (2009) Sol Energy Mater Sol Cells , vol.93 , pp. 577
    • Dejene, F.B.1
  • 5
    • 64849099407 scopus 로고    scopus 로고
    • Nanoscale structural and mechanical characterization of the cell wall of bamboo fibers
    • Zou L, Jin H, Lu WY, Li XD: Nanoscale structural and mechanical characterization of the cell wall of bamboo fibers. Mater Sci Eng C 2009, 29:1375.
    • (2009) Mater Sci Eng C , vol.29 , pp. 1375
    • Zou, L.1    Jin, H.2    Lu, W.Y.3    Li, X.D.4
  • 6
    • 79951530896 scopus 로고    scopus 로고
    • Electrical self-healing of mechanically damaged zinc oxide nanobelts
    • Zhang J, Xu ZH, Webb RA, Li XD: Electrical self-healing of mechanically damaged zinc oxide nanobelts. Nano Lett 2011, 11:241.
    • (2011) Nano Lett , vol.11 , pp. 241
    • Zhang, J.1    Xu, Z.H.2    Webb, R.A.3    Li, X.D.4
  • 8
    • 84864830948 scopus 로고    scopus 로고
    • Mechanical characteristics of Mg-doped GaN thin films by nanoindentation
    • Jian SR, Ke WC, Juang JY: Mechanical characteristics of Mg-doped GaN thin films by nanoindentation. Nanosci Nanotechnol Lett 2012, 4:598.
    • (2012) Nanosci Nanotechnol Lett , vol.4 , pp. 598
    • Jian, S.R.1    Ke, W.C.2    Juang, J.Y.3
  • 9
    • 84857447007 scopus 로고    scopus 로고
    • Structural and nanomechanical properties of a-plane ZnO thin films deposited under different oxygen partial pressure
    • Jian SR, Chen HG, Chen GJ, Jang JSC, Juang JY: Structural and nanomechanical properties of a-plane ZnO thin films deposited under different oxygen partial pressure. Curr Appl Phys 2012, 12:849.
    • (2012) Curr Appl Phys , vol.12 , pp. 849
    • Jian, S.R.1    Chen, H.G.2    Chen, G.J.3    Jang, J.S.C.4    Juang, J.Y.5
  • 10
    • 0026875935 scopus 로고
    • An improved technique for determining hardness and elastic-modulus using load and displacement sensing indentation experiments
    • Oliver WC, Pharr GM: An improved technique for determining hardness and elastic-modulus using load and displacement sensing indentation experiments. J Mater Res 1992, 7:1564.
    • (1992) J Mater Res , vol.7 , pp. 1564
    • Oliver, W.C.1    Pharr, G.M.2
  • 11
    • 0032647950 scopus 로고    scopus 로고
    • Substrate effects on nanoindentation mechanical property measurement of soft films on hard substrates
    • Tsui TY, Pharr GM: Substrate effects on nanoindentation mechanical property measurement of soft films on hard substrates. J Mater Res 1999, 14:292.
    • (1999) J Mater Res , vol.14 , pp. 292
    • Tsui, T.Y.1    Pharr, G.M.2
  • 12
    • 0036478720 scopus 로고    scopus 로고
    • A review of nanoindentation continuous stiffness measurement technique and its applications
    • Li XD, Bhushan B: A review of nanoindentation continuous stiffness measurement technique and its applications. Mater Charact 2002, 48:11.
    • (2002) Mater Charact , vol.48 , pp. 11
    • Li, X.D.1    Bhushan, B.2
  • 16
    • 84859805431 scopus 로고    scopus 로고
    • Indentation-induced mechanical deformation behaviors of AlN thin films deposited on c-plane sapphire
    • Jian SR, Juang JY: Indentation-induced mechanical deformation behaviors of AlN thin films deposited on c-plane sapphire. J Nanomater 2012, 2012:914184.
    • (2012) J Nanomater , vol.2012 , pp. 914184
    • Jian, S.R.1    Juang, J.Y.2
  • 17
    • 36849025376 scopus 로고    scopus 로고
    • Size dependency of the elastic modulus of ZnO nanowires: Surface stress effect
    • Wang GF, Li XD: Size dependency of the elastic modulus of ZnO nanowires: surface stress effect. Appl Phys Lett 2007, 91:231912.
    • (2007) Appl Phys Lett , vol.91 , pp. 231912
    • Wang, G.F.1    Li, X.D.2
  • 18
    • 36249021611 scopus 로고    scopus 로고
    • Nanomechanical characterization of one-step combustion-synthesized Al4B2O9 and Al18B4O33 nanowires
    • Tao XY, Wang XN, Li XD: Nanomechanical characterization of one-step combustion-synthesized Al4B2O9 and Al18B4O33 nanowires. Nano Lett 2007, 7:3172.
    • (2007) Nano Lett , vol.7 , pp. 3172
    • Tao, X.Y.1    Wang, X.N.2    Li, X.D.3
  • 19
    • 77951023664 scopus 로고    scopus 로고
    • Nanoindentation-induced phase transformation in (110)-oriented Si single crystals
    • Jian SR, Chen GJ, Juang JY: Nanoindentation-induced phase transformation in (110)-oriented Si single crystals. Curr Opin Solid State Mater Sci 2010, 14:69.
    • (2010) Curr Opin Solid State Mater Sci , vol.14 , pp. 69
    • Jian, S.R.1    Chen, G.J.2    Juang, J.Y.3
  • 21
    • 39349101219 scopus 로고    scopus 로고
    • Cross-sectional transmission electron microscopy observations of structural damage in Al0.16 Ga0.84N thin film under contact loading
    • Jian SR, Juang JY, Lai YS: Cross-sectional transmission electron microscopy observations of structural damage in Al0.16 Ga0.84N thin film under contact loading. J Appl Phys 2008, 103:033503.
    • (2008) J Appl Phys , vol.103 , pp. 033503
    • Jian, S.R.1    Juang, J.Y.2    Lai, Y.S.3
  • 23
    • 29044433258 scopus 로고    scopus 로고
    • Nano-indentation of coatings
    • Bull SJ: Nano-indentation of coatings. J Phys D Appl Phys 2005, 38:R393.
    • (2005) J Phys D Appl Phys , vol.38
    • Bull, S.J.1
  • 24
    • 13844280308 scopus 로고    scopus 로고
    • Indentation-induced phase transformation in silicon: Influences of load, rate and indenter angle on the transformation behavior
    • Jang J, Lance MJ, Wen S, Tsui TY, Pharr GM: Indentation-induced phase transformation in silicon: influences of load, rate and indenter angle on the transformation behavior. Acta Mater 2005, 53:1759.
    • (2005) Acta Mater , vol.53 , pp. 1759
    • Jang, J.1    Lance, M.J.2    Wen, S.3    Tsui, T.Y.4    Pharr, G.M.5
  • 25
    • 33847074211 scopus 로고    scopus 로고
    • Effect of pressure on the structural properties and electronic band structure of GaSe
    • Schwarz U, Olguin D, Cantarero A, Hanfland M, Syassen K: Effect of pressure on the structural properties and electronic band structure of GaSe. Phys Stat Sol B 2007, 244:244.
    • (2007) Phys Stat Sol B , vol.244 , pp. 244
    • Schwarz, U.1    Olguin, D.2    Cantarero, A.3    Hanfland, M.4    Syassen, K.5
  • 26
    • 0041193484 scopus 로고    scopus 로고
    • Deformation of sapphire induced by a spherical indentation on the (1010) plane
    • Nowak R, Sekino T, Maruno S, Niihara K: Deformation of sapphire induced by a spherical indentation on the (1010) plane. Appl Phys Lett 1996, 68:1063.
    • (1996) Appl Phys Lett , vol.68 , pp. 1063
    • Nowak, R.1    Sekino, T.2    Maruno, S.3    Niihara, K.4
  • 27
    • 34547306498 scopus 로고    scopus 로고
    • Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films
    • Chien CH, Jian SR, Wang CT, Juang JY, Huang JC, Lai YS: Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films. J Phys D Appl Phys 2007, 40:3985.
    • (2007) J Phys D Appl Phys , vol.40 , pp. 3985
    • Chien, C.H.1    Jian, S.R.2    Wang, C.T.3    Juang, J.Y.4    Huang, J.C.5    Lai, Y.S.6
  • 28
    • 85040956871 scopus 로고
    • Cambridge: Cambridge University Press
    • Johnson KL: Contact Mechanics. Cambridge: Cambridge University Press; 1985.
    • (1985) Contact Mechanics
    • Johnson, K.L.1
  • 30
    • 0038237009 scopus 로고    scopus 로고
    • Pop-in effects as homogeneous nucleation of dislocations during nanoindentation
    • Lorenz D, Zeckzer A, Hilpert U, Grau P, Johnson H, Leipner HS: Pop-in effects as homogeneous nucleation of dislocations during nanoindentation. Phys Rev B 2003, 67:172101.
    • (2003) Phys Rev B , vol.67 , pp. 172101
    • Lorenz, D.1    Zeckzer, A.2    Hilpert, U.3    Grau, P.4    Johnson, H.5    Leipner, H.S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.