Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series

Ultramicroscopy

Volumn 121, Issue , 2012, Pages 31-37

  Kimoto, Koji ^a,c   Kurashima, Keiji ^a   Nagai, Takuro ^a   Ohwada, Megumi ^a   Ishizuka, Kazuo ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Higashimatsuyama   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

High resolution transmission electron microscopy; Information limit; Low acceleration voltage; Monochromator; Spherical aberration corrector; Young fringe

Indexed keywords

3-D FOURIER TRANSFORMS; ACCELERATION VOLTAGES; DIFFRACTOGRAMS; GE THIN FILMS; IMAGING PERFORMANCE; INFORMATION LIMIT; INFORMATION TRANSFERS; LINEAR IMAGING; SPHERICAL ABERRATION CORRECTORS; STANDARD SPECIMENS; TEM SYSTEM; TRANSMISSION ELECTRON MICROSCOPY TEM; YOUNG FRINGE;

ABERRATIONS; GERMANIUM; MONOCHROMATORS; TRANSMISSION ELECTRON MICROSCOPY;

THREE DIMENSIONAL;

ARTICLE; CONTROLLED STUDY; ELECTRIC POTENTIAL; FILM; FOURIER TRANSFORMATION; IMAGE PROCESSING; IMAGING SYSTEM; INFORMATION PROCESSING; THREE DIMENSIONAL FOURIER TRANSFORM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84865507602     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.06.012     Document Type: Article

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