Influence of anti-symmetric wave aberrations and the simple correction filter in the Fourier space

Journal of Electron Microscopy

Volumn 48, Issue 4, 1999, Pages 417-429

  Ikuta, Takashi ^a  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

Anti symmetric wave aberration; Coma aberration correction; High resolution electron microscopy; Primary coma aberration

Indexed keywords

BANDPASS FILTERS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE RESOLUTION; OPTICAL DATA PROCESSING;

ABERRATION CORRECTION; ANTI-SYMMETRIC; ANTI-SYMMETRIC WAVE ABERRATION; COMA ABERRATION CORRECTION; FOURIER SPACE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; PRIMARY COMA ABERRATION; SIMPLE++; SPHERICAL ABERRATIONS; WAVE ABERRATIONS;

ABERRATIONS;

EID: 0032830043     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023697     Document Type: Article

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