Linear versus non-linear structural information limit in high-resolution transmission electron microscopy

Ultramicroscopy

Volumn 110, Issue 11, 2010, Pages 1404-1410

  Van Aert, S ^a   Chen, J H ^b   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b HUNAN UNIVERSITY   (China)

Author keywords

Aberration correction; Damping envelope function; High resolution transmission electron microscopy; Information limit; Non linear imaging; Resolution

Indexed keywords

ABERRATION CORRECTION; ANALYTICAL EXPRESSIONS; CLOSED FORM; DEFOCUS; DIFFERENT EFFECTS; DIFFRACTOGRAMS; DYNAMICAL SCATTERING; EXIT PLANES; HEAVY ATOMS; HIGH SPATIAL FREQUENCY; IMAGE PLANE; INFORMATION LIMIT; LINEAR IMAGING; LINEAR TRANSFER; LOW INDEX; MODEL-BASED METHOD; NON-LINEAR; NONLINEAR IMAGING; NONLINEAR INTERACTIONS; PERFORMANCE CRITERION; RESOLUTION; SCATTERING OBJECTS; SPATIAL OBJECTS; SPHERICAL ABERRATIONS; STRUCTURAL INFORMATION; STRUCTURE PARAMETER; TEMPORAL COHERENCE; WEAK PHASE OBJECT; YOUNG'S FRINGES; ZONE AXIS;

ABERRATIONS; DAMPING; ELECTRON MICROSCOPY; ELECTRONS; SCATTERING;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; CONTROLLED STUDY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE PROCESSING; INFORMATION PROCESSING; LINEAR SYSTEM; NONLINEAR SYSTEM; QUANTITATIVE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77956226634     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.07.001     Document Type: Article

References (34)

1. Scherzer O. The theoretical resolution limit of the electron microscope. Journal of Applied Physics 1949, 20:20-28.
2. Spence J.C.H. Experimental High-Resolution Electron Microscopy 1988, Oxford University Press, New York. second ed.
3. O'Keefe M.A. 'Resolution' in high-resolution electron microscopy. Ultramicroscopy 1992, 47:282-297.
4. M.A. O'Keefe, in: Proceedings of the 37th Annual EMSA Meeting, San Antonio, TX, 1979.
5. Rose H. Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope. Optik 1990, 85:19-24.
6. Chang L.Y., Kirkland A.I., Titchmarsh J.M. Ultramicroscopy 2006, 106:301-306.
7. Lichte H. Electron image plane off-axis holography of atomic structures. Advances in Optical and Electron Microscopy 1991, vol. 12:25-91. Academic Press, London.
8. Schiske P. Image processing using additional statistical information about the object. Image Processing and Computer-aided Design in Electron Optics 1973, 82-90. Academic Press, London. P.W. Hawkes (Ed.).
9. Kirkland E.J. Improved high resolution image processing of bright field electron micrographs I. Theory. Ultramicroscopy 1984, 15:151-172.
10. Van Dyck D., Coene W. A new procedure for wave function restoration in high resolution electron microscopy. Optik 1987, 77:125-128.
11. Coene W.M.J., Thust A., Op de Beeck M., Van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 1996, 64:109-135.
12. Van Aert S., Chang L.Y., Bals S., Kirkland A.I., Van Tendeloo G. Ultramicroscopy 2009, 109:237-246.
13. Frank J. Optik 1976, 44:379.
14. Van Dyck D., Van Aert S., den Dekker A.J., van den Bos A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?. Ultramicroscopy 2003, 98:27-42.
15. de Jong A.F., Van Dyck D. Ultimate resolution and information in electron microscopy II. The information limit of transmission electron microscopes. Ultramicroscopy 1993, 49:66-80.
16. den Dekker A.J., Van Aert S., Van Dyck D., van den Bos A., Geuens P. Ultramicroscopy 2001, 89:275.
17. Verbeeck J., Van Aert S. Ultramicroscopy 2004, 101:207.
18. Van Aert S., den Dekker A.J., van den Bos A., Van Dyck D., Chen J.H. Ultramicroscopy 2005, 104:107.
19. Bals S., Van Aert S., Van Tendeloo G., Ávila-Brande D. Physical Review Letters 2006, 96:096106-1-096106-4.
20. Van Aert S., Verbeeck J., Erni R., Bals S., Luysberg M., Van Dyck D., Van Tendeloo G. Ultramicroscopy 2009, 109:1236-1244.
21. den Dekker A.J., Van Aert S., van den Bos A., Van Dyck D. Ultramicroscopy 2005, 104:83.
22. Van Dyck D., Lichte H., van der Mast K.D. Sub-angstrom structure characterisation: the Brite-Euram route towards one angstrom. Ultramicroscopy 1996, 64:1-15.
23. Van Dyck D., de Jong A.F. Ultimate resolution and information in electron microscopy: general principles. Ultramicroscopy 1992, 47:266-281.
24. Williams D.B., Carter C.B. Transmission Electron Microscopy-Basics, Diffraction, Imaging, Spectrometry 1996, Plenum, New York.
25. Kujawa S., Erni R., Freitag B., Tiemeijer P., Stekelenburg M. Microscopy and Microanalysis 2006, 12:1470-1471.
26. Barthel J., Thust A. Physical Review Letters 2008, 101:200801-1-200801-4.
27. Fejes P. Acta Crystallographica A 1977, 33:109.
28. Ishizuka K. Ultramicroscopy 1980, 5:55-65.
29. Geuens P., Van Dyck D. The S-state model: a work horse for HRTEM. Ultramicroscopy 2002, 93:179-198.
30. Van Aert S., Geuens P., Van Dyck D., Kisielowski C., Jinschek J.R. Ultramicroscopy 2007, 107:551-558.
31. Goodman J.W. Introduction to Fourier Optics 1968, McGraw-Hill, San Francisco.
32. Van Aert S., Van Dyck D., den Dekker A.J. Optics Express 2006, 14:3830-3839.
33. Rayleigh L. Wave theory of light. Scientific Papers by John William Strutt, Baron Rayleigh 1902, vol. 3:47-189. Cambridge University Press, Cambridge.
34. Van Dyck D. High-resolution electron microscopy. Advances in Imaging and Electron Physics 2002, vol. 123:105-171. Academic Press, San Diego.