Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEM

Journal of Microscopy

Volumn 208, Issue 3, 2002, Pages 224-228

  Kimoto, K ^a   Matsui, Y ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

EELS; Energy resolution; Field emission gun; Script; Software; TEM

Indexed keywords

ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; FIELD EMISSION; MAGNETIC CORES; TRANSMISSION ELECTRON MICROSCOPY;

CORE LOSS; ELECTRON ENERGY-LOSS SPECTRA; ENERGY RESOLUTIONS; FIELD EMISSION GUNS; SCRIPT; SOFTWARE; SOFTWARE TECHNIQUES; SPECTRUM MEASUREMENT; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; COMPUTER PROGRAM; ELECTRON ENERGY LOSS SPECTROSCOPY; FIELD EMISSION; PRIORITY JOURNAL; REPRODUCIBILITY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037917004     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.01083.x     Document Type: Article

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