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Volumn 119, Issue , 2012, Pages 18-23

LEEM and UHV-PEEM: A retrospective

Author keywords

Low energy electron microscopy; Photo emission electron microscopy; Retrospective

Indexed keywords

LOW ENERGY ELECTRON MICROSCOPY; PHOTOEMISSION ELECTRON MICROSCOPY; RETROSPECTIVE; UV-PEEM;

EID: 84865365484     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.006     Document Type: Article
Times cited : (35)

References (81)
  • 4
    • 11744379648 scopus 로고
    • Verlag Moderne Industrie, Munich
    • Bauer E. Elektronenbeugung 1958, Verlag Moderne Industrie, Munich.
    • (1958) Elektronenbeugung
    • Bauer, E.1
  • 8
    • 84865361784 scopus 로고
    • R. Ueda (Ed.), Proceedings of the Sixth International Congress on Electron Microscopy, Kyoto, Maruzen, Tokyo
    • G. Turner, E. Bauer, in: R. Ueda (Ed.), Proceedings of the Sixth International Congress on Electron Microscopy, Kyoto, Maruzen, Tokyo, 1966, 1, p. 163.
    • (1966) , vol.1 , pp. 163
    • Turner, G.1    Bauer, E.2
  • 10
    • 84865397130 scopus 로고
    • Koch W. Optik 1967, 25:523.
    • (1967) Optik , vol.25 , pp. 523
    • Koch, W.1
  • 14
    • 84865392087 scopus 로고
    • Ph.D. Thesis, TU Clausthal
    • W. Telieps, Ph.D. Thesis, TU Clausthal, 1983.
    • (1983)
    • Telieps, W.1
  • 18
    • 84865392082 scopus 로고
    • Augerelektronen-Spektroskopie und -Mikroskopie, in: Leopoldina-Symposium, Physik und Chemie der Kristalloberfläche, Halle, DDR, unpublished
    • E. Bauer: Augerelektronen-Spektroskopie und -Mikroskopie, in: Leopoldina-Symposium, Physik und Chemie der Kristalloberfläche, Halle, DDR, 1978, unpublished.
    • (1978)
    • Bauer, E.1
  • 19
    • 0007533841 scopus 로고
    • Emission and low energy reflection electron microscopy
    • Plenum Press, New York, NATO ASI Series B: Physics
    • Bauer E., Telieps W. Emission and low energy reflection electron microscopy. Surface and Interface Characterization by Electron Optical Methods 1988, vol. 191:195-233. Plenum Press, New York, NATO ASI Series B: Physics.
    • (1988) Surface and Interface Characterization by Electron Optical Methods , vol.191 , pp. 195-233
    • Bauer, E.1    Telieps, W.2
  • 26
    • 0012278577 scopus 로고    scopus 로고
    • Cathode lens spectromicroscopy with a low-energy electron microscope
    • Springer, Berlin, III J. Thieme, G. Schmahl, D. Rudolph, E. Umbach (Eds.)
    • Lilienkamp G., Koziol C., Schmidt T., Bauer E. Cathode lens spectromicroscopy with a low-energy electron microscope. X-Ray Microscopy and Spectromicroscopy 1998, Springer, Berlin, pp. III 25-34. J. Thieme, G. Schmahl, D. Rudolph, E. Umbach (Eds.).
    • (1998) X-Ray Microscopy and Spectromicroscopy , pp. 25-34
    • Lilienkamp, G.1    Koziol, C.2    Schmidt, T.3    Bauer, E.4
  • 27
    • 33746247251 scopus 로고    scopus 로고
    • Multi-method high-resolution surface analysis with slow electrons
    • Springer, Berlin, and references therein, F. Ernst, M. Rühle (Eds.)
    • Bauer E., Schmidt T. Multi-method high-resolution surface analysis with slow electrons. High-Resolution Imaging and Spectrometry of Materials 2003, Springer, Berlin, and references therein. F. Ernst, M. Rühle (Eds.).
    • (2003) High-Resolution Imaging and Spectrometry of Materials
    • Bauer, E.1    Schmidt, T.2
  • 31
    • 84865392083 scopus 로고    scopus 로고
    • http://www.elmitec-gmbh.com/Leem.php?Bereich=LEEM4.
  • 37
    • 84865350546 scopus 로고    scopus 로고
    • http://www.elmitec-gmbh.com/AC.php?Bereich=ACLEEM.
  • 38
    • 84865350539 scopus 로고    scopus 로고
    • http://www.specs.de/cms/upload/PDFs/ApplNotes/LEEM/TNotes-Aberration_Correction-current_results_V2.pdf.
  • 39
    • 77953607049 scopus 로고    scopus 로고
    • Principles of dual-beam low-energy electron microscopy
    • Academic Press, Burlington
    • Mankos M., Spasov V., Munro E. Principles of dual-beam low-energy electron microscopy. Advances in Imaging and Electron Physics 2010, Vol. 161:1-53. Academic Press, Burlington.
    • (2010) Advances in Imaging and Electron Physics , vol.161 , pp. 1-53
    • Mankos, M.1    Spasov, V.2    Munro, E.3
  • 40
    • 84865350543 scopus 로고    scopus 로고
    • http://www.dicomps.com/index.php/en/electron-optics-systems/electron-microscopes/leem.
  • 42
    • 0000095629 scopus 로고
    • Spin polarized low energy electron microscopy of surface magnetic structure, in: T. Suzuki, Y. Sugita, H.M. Clemens, K. Ouchi, D.E. Laughlin, (Eds.), Magnetic Materials: Microstructure and Properties, MRS Symposium Proceedings
    • M.S. Altman, I. Hurst, G. Marx, H. Pinkvos, H. Poppa, E. Bauer: Spin polarized low energy electron microscopy of surface magnetic structure, in: T. Suzuki, Y. Sugita, H.M. Clemens, K. Ouchi, D.E. Laughlin, (Eds.), Magnetic Materials: Microstructure and Properties, MRS Symposium Proceedings, vol. 232, 1991, pp. 125-132.
    • (1991) , vol.232 , pp. 125-132
    • Altman, M.S.1    Hurst, I.2    Marx, G.3    Pinkvos, H.4    Poppa, H.5    Bauer, E.6
  • 50
    • 84865350545 scopus 로고
    • J.B. Poole (Ed.), Photoemission microscopy and surface analysis, in: Electron Microscopy (Proc. 10th Internat. Congr. Electron Microscopy, Frankfurt
    • H. Bethge, G. Gerth, D. Matern: J.B. Poole (Ed.), Photoemission microscopy and surface analysis, in: Electron Microscopy (Proc. 10th Internat. Congr. Electron Microscopy, Frankfurt, 1982) Vol. 1, pp. 69-78.
    • (1982) , vol.1 , pp. 69-78
    • Bethge, H.1    Gerth, G.2    Matern, D.3
  • 54
    • 0027147984 scopus 로고
    • Stöhr J., et al. Science 1993, 259:658.
    • (1993) Science , vol.259 , pp. 658
    • Stöhr, J.1
  • 58
    • 84865383646 scopus 로고    scopus 로고
    • http://www.staibinstruments.com/products/peem/peem.html.
  • 60
    • 84865383644 scopus 로고    scopus 로고
    • http://www.elmitec-gmbh.com/Peem.php?Bereich=PEEMSpec.
  • 62
    • 84865392081 scopus 로고    scopus 로고
    • http://www.omicron.de/en/products/nanoesca-/instrument-concept.
  • 63
    • 84865350541 scopus 로고    scopus 로고
    • http://www.omicron.de/en/products/focus-peem-/variants.
  • 64
    • 84865350542 scopus 로고    scopus 로고
    • http://www.elmitec-gmbh.com/Peem.php?Bereich=PEEMAnalyzer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.