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Volumn 22, Issue 36, 2012, Pages 19047-19053

Tailored interfaces for self-patterning organic thin-film transistors

(7) Ward, Jeremy W a Loth, Marsha A b Kline, R Joseph c Coll, Mariona d Ocal, Carmen d Anthony, John E b Jurchescu, Oana D a

a WAKE FOREST UNIVERSITY (United States)

b UNIVERSITY OF KENTUCKY (United States)

c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

d INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

BENZENE; CHEMICAL SENSORS; FIELD EFFECT TRANSISTORS; MOLECULES; ORGANIC POLYMERS; SELF ASSEMBLED MONOLAYERS; THIN FILM TRANSISTORS; X RAY DIFFRACTION;

BENZENE RING; CRYSTALLINE ORDER; CURRENT PATHS; ELECTRONIC PERFORMANCE; FIELD-EFFECT MOBILITIES; GRAZING INCIDENCE X-RAY DIFFRACTION; HALOGEN-HALOGEN INTERACTIONS; HIGH MOBILITY; KELVIN PROBE MEASUREMENTS; LOW-COMPLEXITY; LOW-POWER CONSUMPTION; ORDERS OF MAGNITUDE; ORGANIC THIN FILM TRANSISTORS; PATTERNING METHODS; SELF-ALIGN; SEMICONDUCTOR MOLECULES; STRUCTURAL CHANGE;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 84865245232 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm33974a Document Type: Article

Times cited : (71)

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