Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces

Journal of Applied Physics

Volumn 112, Issue 3, 2012, Pages

  Da, B ^a   Mao, S F ^a   Zhang, G H ^a   Wang, X P ^a   Ding, Z J ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AL SAMPLE; BACKSCATTERED ELECTRONS; DEPTH DISTRIBUTION; EXPERIMENTAL DATA; FINITE ELEMENT; MONTE CARLO MODELING; MONTE CARLO SIMULATION; PLASMON EXCITATIONS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; ROUGH SURFACES; SURFACE EXCITATIONS; SURFACE PLASMON EXCITATION; SURFACE ROUGHNESS EFFECTS; TRIANGLE MESH;

ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; FINITE ELEMENT METHOD; MONTE CARLO METHODS; REELS; SURFACE MEASUREMENT; SURFACE ROUGHNESS; THREE DIMENSIONAL;

ELECTRON ENERGY ANALYZERS;

EID: 84865234344     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4739491     Document Type: Article

References (33)

1. C. S. Fadley, R. Baird, W. Siekhaus, T. Novakov, and S. A. L. Bergstrom, J. Electron Spectrosc. Relat. Phenom. 4, 93 (1974). 10.1016/0368-2048(74)90001-2
2. J. Zemek, P. Jiricek, A. Jablonski, and B. Lesiak, Surf. Interface Anal. 34, 215 (2002). 10.1002/sia.1286
3. C. Robert, L. Bideux, B. Gruzza, E. Vazsonyi, and G. Gergely, Appl. Surf. Sci. 115, 111 (1997). 10.1016/S0169-4332(97)80192-4
4. A. Jablonski, K. Olejnik, and J. Zemek, J. Electron Spectrosc. Relat. Phenom. 152, 100 (2006). 10.1016/j.elspec.2006.04.003 (Pubitemid 43776646)
5. S. Chelda, C. Robert-Goumet, B. Gruzza, L. Bideux, and G. Monier, Surf. Sci. 602, 2114 (2008). 10.1016/j.susc.2008.04.020
6. B. Lesiak, A. Kosinski, R. Nowakowski, L. Kover, J. Toth, D. Varga, I. Cserny, A. Sulyok, and G. Gergely, Surf. Interface Anal. 39, 798 (2007). 10.1002/sia.2592 (Pubitemid 47608081)
7. W. Dolinski, S. Mroz, and M. Zagorski, Surf. Sci. 200, 361 (1988). 10.1016/0039-6028(88)90538-9
8. P. Jiricek, J. Zemek, P. Lejcek, B. Lesiak, A. Jablonski, and M. Cernansky, J. Vac. Sci. Technol. A 20, 447 (2002). 10.1116/1.1450587 (Pubitemid 34413236)
9. B. Da, S. F. Mao, G. H. Zhang, X. P. Wang, and Z. J. Ding, Surf. Interface Anal. 44, 647 (2012). 10.1002/sia.4807
10. B. Strawbridge, R. K. Singh, C. Beach, S. Mahajan, and N. Newmana, J. Vac. Sci. Technol. A 24, 1776 (2006). 10.1116/1.2218855 (Pubitemid 44370766)
11. B. Strawbridge, N. Cernetic, J. Chapley, R. K. Singh, S. Mahajan, and N. Newmana, J. Vac. Sci. Technol. A 29, 041602 (2011). 10.1116/1.3584775
12. C. J. Powell, Phys. Rev. 175, 972 (1968). 10.1103/PhysRev.175.972
13. Z. J. Ding, H. M. Li, Q. R. Pu, and Z. M. Zhang, Phys. Rev. B 66, 085411 (2002). 10.1103/PhysRevB.66.085411
14. Z. J. Ding and R. Shimizu, Phys. Rev. B 61, 14128 (2000). 10.1103/PhysRevB.61.14128
15. B. Da, S. F. Mao, and Z. J. Ding, J. Phys.: Condens. Matter 23, 395003 (2011). 10.1088/0953-8984/23/39/395003
16. N. F. Mott, Proc. R. Soc. London A 124, 425 (1929). 10.1098/rspa.1929. 0127
17. Y. Yamazaki, Ph.D. Thesis, Osaka University, 1977.
18. R. A. Bonham and T. G. Strand, J. Chem. Phys. 39, 2200 (1963). 10.1063/1.1701417
19. R. H. Ritchie and A. L. Marusak, Surf. Sci. 4, 234 (1966). 10.1016/0039-6028(66)90003-3
20. F. Garcia-Moliner and F. Flores, Introduction to the Theory of Solid Surfaces (Cambridge University, Cambridge, 1979).
21. B. Gumhalter, Prog. Surf. Sci. 15, 1 (1984). 10.1016/0079-6816(84)90003-0 (Pubitemid 15420729)
22. R. H. Ritchie, A. Howie, P. M. Echenique, G. J. Basbas, T. L. Ferrell, and J. C. Ashley, Scanning Microsc. Suppl. 4, 45 (1990).
23. S. Shindo, Solid State Phenom. 28/29, 103 (1992). 10.4028/www.scientific. net/SSP.28-29.103
24. Z. J. Ding, J. Phys.: Condens. Matter 10, 1733 (1998). 10.1088/0953-8984/10/8/009
25. Z. J. Ding, J. Phys.: Condens. Matter 10, 1753 (1998). 10.1088/0953-8984/10/8/010
26. Z. J. Ding, Phys. Rev. B 55, 9999 (1997). 10.1103/PhysRevB.55.9999
27. Z. J. Ding and R. Shimizu, Phys. Rev. B 61, 14128 (2000). 10.1103/PhysRevB.61.14128
28. T. R. Thomas, Rough Surfaces (Longman, London, 1982).
29. D. J. Whitehouse, Handbook of Surface Metrology (Institute of Physics, Bristol, 1994).
30. A. W. Czanderna, T. E. Madey, and C. J. Powell, Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Plenum, New York, 1998).
31. ISO 4287:1997, Geometrical Product Specifications (GPS)-Surface Texture: Profile Method-Terms, Definitions and Surface Texture Parameters, International Organisation for Standardisation, Geneva, 1997.
32. R. Shimizu and Z. J. Ding, Rep. Prog. Phys. 55, 487 (1992). 10.1088/0034-4885/55/4/002
33. Z. J. Ding and R. Shimizu, Scanning 18, 92 (1996). 10.1002/sca.1996. 4950180204