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Volumn 20, Issue 2, 2002, Pages 447-455

Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SPECTROSCOPY; GRAIN SIZE AND SHAPE; NICKEL; SILICON; SURFACE ROUGHNESS; TEXTURES;

EID: 0036495204     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1450587     Document Type: Article
Times cited : (11)

References (39)
  • 1
    • 0006304972 scopus 로고    scopus 로고
    • ASTM Standard E673-95c, American Standards for Testing and Materials, West Conshohocken, PA, Vol. 3.06
    • (1997) Annual Book of ASTM Standards , pp. 907
  • 12
    • 0006267123 scopus 로고    scopus 로고
    • Ph.D. thesis, Karls-Universität, Tübingen, Germany
    • (1996)
    • Koch, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.