Validity of the semi-classical approach for calculation of the surface excitation parameter

Journal of Physics Condensed Matter

Volumn 23, Issue 39, 2011, Pages

  Da, B ^a   Mao, S F ^a   Ding, Z J ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC RESPONSE THEORY; EXPERIMENTAL DATA; EXPERIMENTAL SPECTRA; INELASTIC CROSS SECTIONS; INELASTIC MEAN FREE PATH; MONTE CARLO SIMULATION; MOVING CHARGE; NUMERICAL CALCULATION; QUANTUM MECHANICAL; QUANTUM MODELS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; SELF ENERGY; SEMICLASSICAL APPROACHES; SOLID SURFACE; SPECTRAL SHAPES; STOPPING POWER; SURFACE EXCITATION PARAMETERS; SURFACE EXCITATIONS; SURFACE PLASMON EXCITATION;

COMPUTER SIMULATION; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; ENERGY DISSIPATION; MONTE CARLO METHODS; QUANTUM THEORY; SILICON COMPOUNDS;

ELECTRIC EXCITATION;

EID: 80052949446     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/39/395003     Document Type: Article

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