Morphology, surface roughness, electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers

Surface and Interface Analysis

Volumn 39, Issue 10, 2007, Pages 798-804

  Lesiak, B ^a   Kosinski A ^a   Nowakowski, R ^a   Kover L ^b   Toth J ^b   Varga, D ^b   Cserny, I ^b   Sulyok, A ^c   Gergely, G ^c  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

^c RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Elastic peak electron spectroscopy; Electron inelastic and quasielastic scattering; Polymers; Surface morphology and roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; INELASTIC SCATTERING; KINETIC ENERGY; PLASMONS; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC PEAK ELECTRON SPECTROSCOPY; QUASIELASTIC SCATTERING; SURFACE ATOMIC COMPOSITION;

SURFACES;

EID: 35349017832     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2592     Document Type: Article

References (33)

1. Gergely G. Prog. Surf. Sci. 2002; 71: 31.
2. Powell CJ, Jablonski AJ. J. Phys. Chem. Ref. Data 1999; 28: 19.
3. Salanek WE, LögdfundM, Fahlman M, Greczyŕiski G, Kugler Th. Mater. Sci. Eng. R. 2001; 34: 121.
4. Gergely G, Menyhard M, Orosz GT, Lesiak B, Kosinski A, Jablonski A, Nowakowski R, Tóth J, Varga D. Appl. Surf. Sci. 2006; 252: 4982.
5. Gergely G, Menyhard M, Sulyok A, Orosz GT, Lesiak B, Jablonski A, Tóth J, Varga D. Surf. Interface Anal. 2004; 36: 1056.
6. Gergely G, Tóth J, Menyhard M, Varga D, Gurban S, Sulyok A, Kosiński A, Lesiak BJ. J. Electron. Spectrosc. Relat. Phenom. 2006; 154: 14.
7. Lesiak B, Kosinski A, Jablonski A, Sulyok A, Gergely G, Tóth J, Varga D. Acta Phys. Pol., A 2006; 109: 789.
8. ZemekJ, Jiricek P, JablonskiA, Lesiak B. Surf. Interface Anal. 2002; 34: 215.
9. Robert C, Bideux L, Gruzza B, Vazsonyi E, Gergely G. Appl. Surf. Sci. 1997; 115: 111.
10. Jablonski A, Olejnik K, Zemek J. J. Electron. Spectrosc. Relat. Phenom. 2006; 152: 100.
11. ISO 4287. Geometrical Product Specifications (GPS) - Surface Texture: Part 3: Specification of Parameters, 1997.
12. Chen YF. Surf. Sci. 2002; 519: 115.
13. Salma K, Ding ZJ, Li HM, Zhang ZM. Surf. Sci. 2006; 600: 1526.
14. Kwei CM, Li YC, Tung CJ. Surf. Sci. 2006; 600: 3690.
15. Laser D, Seah MP. Phys. Rev. B 1993; 47: 9836.
16. VargaD, Tokési K, Berényi Z, Tóth J, Kövér L. Surf. Interface Anal. 2006; 38: 544.
17. Varga D, Tokési K, Berényi Z, Kövér L, Gergely G, Sulyok A. Surf. Interface Anal. 2001; 31: 1019.
18. Jablonski A. Surf. Sci. 1985; 151: 166.
19. Orosz GT, Sulyok A, Gergely G, GurbanS, Menyhard M. J. Microsc. Microanal. 2003; 9: 343.
20. Tan KL, Khor SH, Neoh KG, Kang EY. J. Phys. Chem. Solids 1991; 52: 673.
21. Adams PN, Lauhlin PJ, Monkmas AP. Synth. Met. 1996; 76: 157.
22. Genies EM, Lapkowski M, Tsintavis C. New. J. Chem. 1888; 12: 181.
23. Presz A, Skibska M, Pilecki M. Powder Handl. Process 1997; 7: 321.
24. Kövér L, Varga D, Cserny I, Tóth J, Tökési K. Surf. Interface Anal. 1992; 19: 9.
25. Moulder JF, Stickle WF, Sobol PE, Bomben KD. Handbook of X-ray Photoelectron Spectroscopy. Perkin Elmer Company: Eden Prairie, Minnesota, 1992.
26. Seah MP. J. Electron. Spectrosc. Relat. Phenom. 1990; 50: 137.
27. Band IM, Kharitonov YuI, Trzaskovskaya MB. At. Data Nucl. Data Tables 1979; 23: 443.
28. Menyhard M, Gergely G, Sulyok A, GurbanS, Lesiak B, Jablonski A, Kosinski A, Tóth J, Varga D. Cent. Eur. J. Phys. 2007; 5: 188.
29. Gergely G, Menyhard M, Gurban S, Jablonski A. J. Surf. Anal. 2005; 12: 140.
30. NIST Elastic-Electron-Scattering Cross-Section Database. Standard Reference Data Program, Database 64, vol. 3.1. National Institute of Standard and Technology: Gaithersburg, 2003.
31. Arbuckle GA, Buecheler NH, Clark C, Wille A. Synth. Met. 1994; 63: 35.
32. Arbuckle GA, Bucheler NM, Hall JW, Valentine KG, Lefrant S, Mevellec JY, Mulazzi E. Synth. Met. 1996; 79: 183.
33. Leiro JA, Heininen MH, Laiho T, Batirev IG. J. Electron. Spectrosc. Relat. Phenom. 2003; 128: 205.