Influence of surface roughness on elastically backscattered electrons

Surface and Interface Analysis

Volumn 44, Issue 6, 2012, Pages 647-652

  Da, B ^a   Mao, S F ^a   Zhang, G H ^a   Wang, X P ^a   Ding, Z J ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

EPES; Monte Carlo simulation; surface roughness

Indexed keywords

BACKSCATTERED ELECTRONS; CYLINDRICAL MIRROR ANALYZER; ELASTIC PEAK; ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON INELASTIC MEAN FREE PATHS; EMISSION ANGLE; EPES; EXPERIMENTAL FACTORS; INELASTIC MEAN FREE PATH; MONTE CARLO MODEL; MONTE CARLO SIMULATION; NI SURFACE; PRIMARY ENERGIES; QUANTITATIVE INFORMATION; ROUGHNESS EFFECTS; SIZE RANGES; SURFACE EXCITATIONS;

BACKSCATTERING; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; EXPERIMENTS; MONTE CARLO METHODS; SURFACES;

SURFACE ROUGHNESS;

EID: 84862798296     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4807     Document Type: Conference Paper

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