Optics of CdS/CdTe thin-film photovoltaics

IEEE Journal of Photovoltaics

Volumn 1, Issue 2, 2011, Pages 187-193

  Li, Jian ^a   Chen, Jie ^b   Sestak, Michelle N ^b   Collins, Robert W ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

Ellipsometry; II VI semiconductor materials; metrology; photovoltaic cells; thin films

Indexed keywords

CDS; CDS/CDTE; CDTE; EXCITED CARRIERS; HIGH-SPEED; MATERIAL DENSITY; MATERIALS ANALYSIS; MATERIALS FABRICATION; MEAN FREE PATH; MULTI-CHANNEL; OPTICAL REFLECTION; STRUCTURAL EVOLUTION; THIN FILM PHOTOVOLTAICS;

CADMIUM CHLORIDE; CADMIUM COMPOUNDS; CADMIUM SULFIDE; COALESCENCE; ELLIPSOMETRY; MEASUREMENTS; METHANOL; OPTICAL PROPERTIES; PHOTOVOLTAIC CELLS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

CADMIUM TELLURIDE;

EID: 84865195759     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2011.2167959     Document Type: Article

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