Optical transition energies as a probe of stress in polycrystalline CdTe thin films

Applied Physics Letters

Volumn 99, Issue 6, 2011, Pages

  Li, Jian ^a   Chen, Jie ^a   Collins, R W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AS-DEPOSITED FILMS; BEST FIT; CDTE; CRITICAL POINTS; DIELECTRIC FUNCTIONS; ENERGY SHIFT; IN-PLANE STRESS; IN-SITU; LINEAR STRESS; OPTICAL TRANSITION ENERGIES; POLYCRYSTALLINE; SUBSTRATE TEMPERATURE;

CADMIUM ALLOYS; CADMIUM CHLORIDE; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

CADMIUM COMPOUNDS;

EID: 84860388844     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3624536     Document Type: Article

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