Bipolar and tri-state unipolar resistive switching behaviors in Ag/ZnFe 2O 4/Pt memory devices

Applied Physics Letters

Volumn 101, Issue 6, 2012, Pages

  Hu, Wei ^a   Chen, Xinman ^b   Wu, Guangheng ^a   Lin, Yanting ^a   Qin, Ni ^a   Bao, Dinghua ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b SOUTH CHINA NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTION DEPOSITION METHOD; CO-EXISTENCE; CONDUCTING FILAMENT; ELECTROCHEMICAL METALLIZATION (ECM); NEGATIVE BIAS; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; THERMOCHEMICAL EFFECTS;

ELECTROFORMING; METALLIZING; PLATINUM;

SWITCHING SYSTEMS;

EID: 84865113808     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4744950     Document Type: Article

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