Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 608, Issue 2, 2009, Pages 363-365

  Battaglia, Marco ^a,b   Contarato, Devis ^b   Denes, Peter ^b   Giubilato, Piero ^b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF PADOVA   (Italy)

Author keywords

Monolithic active pixel sensor; Transmission Electron Microscopy

Indexed keywords

BRIGHT FIELD ILLUMINATION; CMOS SENSORS; DIRECT DETECTION; ELECTRON CLUSTER; IMAGE CONTRASTS; MONOLITHIC ACTIVE PIXEL SENSOR; PIXEL SENSORS; POINT-SPREAD FUNCTION; SPATIAL RESOLUTION;

ELECTRONS; IMAGE SENSORS; LIGHT TRANSMISSION; OPTICAL TRANSFER FUNCTION; PIXELS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

EID: 69249133461     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.07.017     Document Type: Article

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