Fully automated measurement of the modulation transfer function of charge-coupled devices above the nyquist frequency

Microscopy and Microanalysis

Volumn 18, Issue 2, 2012, Pages 336-342

  Van Den Broek, Wouter ^a   Van Aert, Sandra ^a   Van Dyck, Dirk ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

aliasing; beam blocker; charge coupled device; Fourier analysis; modulation transfer function; Nyquist frequency; point spread function; scintillator crystal; transmission electron microscopy

Indexed keywords

EID: 84859121020     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611012633     Document Type: Article

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