Characterisation of a CMOS active pixel sensor for use in the TEAM microscope

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 622, Issue 3, 2010, Pages 669-677

  Battaglia, Marco ^a,b   Contarato, Devis ^a   Denes, Peter ^a   Doering, Dionisio ^a   Duden, Thomas ^a   Krieger, Brad ^a   Giubilato, Piero ^a,c   Gnani, Dario ^a   Radmilovic, Velimir ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA SANTA CRUZ   (United States)

^c UNIVERSITY OF PADOVA   (Italy)

Author keywords

Detection quantum efficiency; Monolithic active pixel sensor; Point spread function; Transmission electron microscopy

Indexed keywords

CHARACTERISATION; CMOS ACTIVE PIXEL SENSORS; CURRENT INCREASE; DETECTION QUANTUM EFFICIENCY; DETECTOR RESPONSE; DIRECT IMAGING; DYNAMIC RANGE; LINE SPREAD FUNCTIONS; MONOLITHIC ACTIVE PIXEL SENSORS; POINT-SPREAD FUNCTION; RADIATION TOLERANCES; SINGLE ELECTRON; TEAM PROJECTS; TRANSMISSION ELECTRON; WELL DEPTH;

ELECTRON BEAMS; ELECTRONS; OPTICAL TRANSFER FUNCTION; PIXELS; SENSORS; TRANSMISSION ELECTRON MICROSCOPY;

QUANTUM EFFICIENCY;

EID: 77957911893     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.07.066     Document Type: Article

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