Inhomogeneous ohmic contacts: Barrier height and contact area determination

Applied Physics Letters

Volumn 101, Issue 5, 2012, Pages

  Li, Yang ^a   Long, Wei ^a   Tung, Raymond T ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHTS; CONTACT AREAS; METAL-SEMICONDUCTOR JUNCTIONS; QUANTITATIVE INFORMATION; SCHOTTKY BARRIER HEIGHTS; SERIES RESISTANCES; SI(1 0 0); TEMPERATURE-DEPENDENT MEASUREMENTS;

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTORS; ELECTRIC RESISTANCE; OHMIC CONTACTS; SEMICONDUCTOR JUNCTIONS; SILICON;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 84864643304     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4742142     Document Type: Article

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