Compositional and electronic properties of Si(001)2 × 1 upon diatomic sulfur interaction

Surface Science

Volumn 433-435, Issue , 1999, Pages 415-419

  Lacharme, J P ^a   Benazzi, N ^a   Sebenne C A ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

Silicon; Sulfur; Surface chemical reaction

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; CRYSTAL LATTICES; ELECTRONIC PROPERTIES; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; PHOTOELECTRON SPECTROSCOPY; SULFUR; SURFACE PROPERTIES; SURFACE STRUCTURE;

PHOTOEMISSION YIELD SPECTROSCOPY; SURFACE RECONSTRUCTION;

SEMICONDUCTING SILICON;

EID: 0033353207     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00450-1     Document Type: Article

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