Focusing of a neutral helium beam below one micron

New Journal of Physics

Volumn 14, Issue , 2012, Pages

  Eder, S D ^a   Reisinger, T ^a   Greve, M M ^a   Bracco, G ^a,b   Holst, B ^a  

^a UNIVERSITY OF BERGEN   (Norway)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGING EFFECT; DE BROGLIE WAVELENGTH; FOCUSED BEAMS; FOCUSING PROPERTIES; FRESNEL; HELIUM ATOM; LOW ENERGIES; MATTER WAVES; NANO-STRUCTURED; NANOMETRE RESOLUTION; NANOMETRES; RESOLUTION LIMITS; ROOM TEMPERATURE; SPOT SIZES; SURFACE DAMAGES; THEORETICAL MODELS; ZONE PLATES;

ATOMS; EXPERIMENTS; FOCUSING;

HELIUM;

EID: 84864370696     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/14/7/073014     Document Type: Article

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