A simple approach to neutral atom microscopy

Review of Scientific Instruments

Volumn 82, Issue 10, 2011, Pages

  Witham, Philip ^a   Sánchez, Erik ^a  

^a PORTLAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW ENERGY SURFACES; NEUTRAL ATOMS; NON DESTRUCTIVE; REFLECTION MODES; SIMPLE APPROACH; SUBMICRON RESOLUTION; THEORETICAL PERFORMANCE; WORKING DISTANCES;

EID: 80655146424     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3650719     Document Type: Article

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