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Physical Review Letters

Volumn 83, Issue 9, 1999, Pages 1755-1758

Determination of atom-surface van der waals potentials from transmission-grating diffraction intensities

(5) Grisenti, R E a Schollkopf W a Toennies, J P a Hegerfeldt, G C b Kohler T b

a MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION (Germany)

b UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000162168 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.83.1755 Document Type: Article

Times cited : (197)

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