Field ionization of helium in a supersonic beam: Kinetic energy of neutral atoms and probability of their field ionization

Ultramicroscopy

Volumn 109, Issue 5, 2009, Pages 413-417

  Holst, B ^a   Piskur, J ^a   Kostrobiy, P P ^b   Markovych, B M ^b   Suchorski, Y ^c  

^a UNIVERSITY OF BERGEN   (Norway)

^b IVAN FRANKO NATIONAL UNIVERSITY OF LVIV   (Ukraine)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Field ion microscopy; Field ionization; Functional integration method; Neutral He beams

Indexed keywords

CALCULATED VALUES; CROSS-SECTIONAL AREAS; DETECTION EFFICIENCIES; ELECTRON DENSITY DISTRIBUTIONS; EXPERIMENTAL DATUM; FIELD EMITTERS; FIELD ION MICROSCOPY; FIELD IONIZATION; FUNCTIONAL INTEGRATION METHOD; HE ATOMS; ION DETECTORS; LOCAL FIELD DISTRIBUTIONS; NEUTRAL ATOMS; NEUTRAL HE BEAMS; NEUTRAL PARTICLES; QUANTUM-MECHANICAL CALCULATIONS; SPATIAL RESOLUTIONS; SPATIALLY RESOLVED; SUPERSONIC BEAMS; TUNGSTEN TIPS;

FUNCTIONAL ANALYSIS; HELIUM; ION MICROSCOPES; IONIZATION OF LIQUIDS; IONS; SURFACE TREATMENT; TUNGSTEN;

ATOMS;

HELIUM; TUNGSTEN;

ARTICLE; ELECTRON BEAM; FIELD ION MICROSCOPY; FIELD IONIZATION; IONIZATION; MATHEMATICAL MODEL; MICROSCOPY; QUANTUM MECHANICS; SURFACE PROPERTY;

EID: 62549124075     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.11.021     Document Type: Article

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