Control of thickness uniformity and grain size in graphene films for transparent conductive electrodes

Nanotechnology

Volumn 23, Issue 3, 2012, Pages

  Wu, Wei ^a   Yu, Qingkai ^a,b   Peng, Peng ^a   Liu, Zhihong ^b   Bao, Jiming ^a   Pei, Shin Shem ^a  

^a UNIVERSITY OF HOUSTON   (United States)

^b Texas State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT PRESSURES; CARBON PRECURSORS; COVER GLASS; CU FOIL; CVD PROCESS; DRIVING FORCES; GRAIN SIZE; GROWTH MECHANISMS; GROWTH MODELS; HIGH ELECTRICAL CONDUCTIVITY; HIGH QUALITY; LARGE-GRAIN; METAL SUBSTRATE; NUCLEATION AND GROWTH; RAMAN SPECTROSCOPY CHARACTERIZATION; SINGLE LAYER; THICKNESS UNIFORMITY; TRANSPARENT CONDUCTIVE;

CARBON FILMS; CHEMICAL VAPOR DEPOSITION; CONDUCTIVE FILMS; COPPER; ELECTRIC CONDUCTIVITY; ELECTRODES; GRAIN SIZE AND SHAPE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

GRAPHENE;

EID: 84862969876     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/3/035603     Document Type: Article

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